SFFSB18 August   2026 TLIN821-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOIC (D, 8) Package
    2. 2.2 VSON (DRB, 8) Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 SOIC (D, 8) Package
    2. 4.2 VSON (DRB, 8) Package
  7. 5Revision History

1 Overview

This document contains information for the TLIN821-Q1 (SOIC (D, 8) and VSON (DRB, 8) packages) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

TLIN821-Q1 Functional Block DiagramFigure 1-1 Functional Block Diagram

The TLIN821-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.