SLLK033 January   2025 THVD9491-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix A: HDR TID Report Data

2.4 Test Configuration and Condition

The main HDR irradiation characterization was performed at 10krad, 20krad and 30krad. The HDR RLAT units that were irradiated to 30krad(Si) were annealed at 25ºC for 72 hours. Units irradiated to 30krad(Si) and were annealed for 72 hours are denoted as 31krad(Si) in the Section 5 . ATE parametric testing was completed before and after the anneal

Table 2-1 lists the serialized samples used for TID Radiation Lot Acceptance Testing (RLAT).

Table 2-1 HDR Characterization Device Information
Control GroupDose Rate = 168.26rads(Si)/s

Effective Dose Rate (Anneal 72 hours) = 115.74mrad(Si)/s

Total Samples: 3

Total Samples: 5 Biased / TID Level

Exposure Levels
0krad (Si)

10krad(Si)

20krad(Si)

30krad(Si)
Biased

Biased

Biased

BiasedBiased + 72 hr anneal
1 - 3

4-8

9-13

14-1819-23