SLLK033 January   2025 THVD9491-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix A: HDR TID Report Data

Abstract

This report discusses the radiation characterization results of the THVD9491-SEP fault-protected full-duplex RS-422/RS-485 transceiver. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 30krad(Si) as a one-time characterization. The results show that all samples passed within the specified limits up to 30krad(Si). Radiation Lot Acceptance Testing (RLAT) will be performed using 5 units at a dose level of 30krad(Si) per MIL-STD-883 TM 1019. All future wafer lots will be tested under the same conditions.

The THVD9491-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43MeV-cm2 / mg, which makes the device an option for low Earth orbit space applications.