SLLSFT3A November   2025  – September 2026 MC121-Q1

PRODMIX  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 I2C Timing Requirements
    7. 5.7 Timing Diagrams
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Motor Control
        1. 6.3.1.1 Duty Input
        2. 6.3.1.2 Duty Curve
        3. 6.3.1.3 Motor Start, Speed Change, and Stop
        4. 6.3.1.4 Open-Loop (Duty Cycle) Control
        5. 6.3.1.5 Closed-Loop (Speed) Control
        6. 6.3.1.6 Commutation
          1. 6.3.1.6.1 Hall Sensor
            1. 6.3.1.6.1.1 Field Direction Definition
            2. 6.3.1.6.1.2 Internal Hall Latch Sensor Output
          2. 6.3.1.6.2 Hall Offset
          3. 6.3.1.6.3 Square Commutation
          4. 6.3.1.6.4 Soft Commutation
        7. 6.3.1.7 PWM Modulation Modes
      2. 6.3.2 Protections
        1. 6.3.2.1 Locked Rotor Protection
        2. 6.3.2.2 Current Limit
        3. 6.3.2.3 Overcurrent Protection (OCP)
        4. 6.3.2.4 VM Undervoltage Lockout (UVLO)
        5. 6.3.2.5 VM Over Voltage Protection (OVP)
        6. 6.3.2.6 Thermal Shutdown (TSD)
        7. 6.3.2.7 Integrated Supply (VM) Clamp
    4. 6.4 Device Functional Modes
      1. 6.4.1 Active Mode
      2. 6.4.2 Sleep and Standby Mode
      3. 6.4.3 Fault Mode
      4. 6.4.4 Test Mode and One-Time Programmable Memory
    5. 6.5 Programming
      1. 6.5.1 I2C Communication
        1. 6.5.1.1 I2C Read
        2. 6.5.1.2 I2C Write
  8. 7 Register Map
    1. 7.1 USR_OTP Registers
    2. 7.2 USR_TM Registers
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 External Components
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Bulk Capacitance
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
    5. 8.5 Hall Element Position
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

7 Register Map

Table 7-1 list the register maps for programming the MC121-Q1 in test programming mode and OTP programming mode. The USER_OTP map (addresses 0x00 to 0x1B) includes OTP registers available for programming during prototyping and end-system production. The USR_TM register map (addresses 0x20 to 0x26) offer configurations to allow system designers to read faults and speed or configure device settings like speed input during system prototyping and development. Burned OTP registers keep written data after power cycle. After burning OTP, the registers can receive new data in test mode, but the burned OTP values are the device defaults when the device power cycles. The test mode registers, USR_TM are not OTP memory registers and are reset during a power cycle.