SLLSFT3A November   2025  – September 2026 MC121-Q1

PRODMIX  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 I2C Timing Requirements
    7. 5.7 Timing Diagrams
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Motor Control
        1. 6.3.1.1 Duty Input
        2. 6.3.1.2 Duty Curve
        3. 6.3.1.3 Motor Start, Speed Change, and Stop
        4. 6.3.1.4 Open-Loop (Duty Cycle) Control
        5. 6.3.1.5 Closed-Loop (Speed) Control
        6. 6.3.1.6 Commutation
          1. 6.3.1.6.1 Hall Sensor
            1. 6.3.1.6.1.1 Field Direction Definition
            2. 6.3.1.6.1.2 Internal Hall Latch Sensor Output
          2. 6.3.1.6.2 Hall Offset
          3. 6.3.1.6.3 Square Commutation
          4. 6.3.1.6.4 Soft Commutation
        7. 6.3.1.7 PWM Modulation Modes
      2. 6.3.2 Protections
        1. 6.3.2.1 Locked Rotor Protection
        2. 6.3.2.2 Current Limit
        3. 6.3.2.3 Overcurrent Protection (OCP)
        4. 6.3.2.4 VM Undervoltage Lockout (UVLO)
        5. 6.3.2.5 VM Over Voltage Protection (OVP)
        6. 6.3.2.6 Thermal Shutdown (TSD)
        7. 6.3.2.7 Integrated Supply (VM) Clamp
    4. 6.4 Device Functional Modes
      1. 6.4.1 Active Mode
      2. 6.4.2 Sleep and Standby Mode
      3. 6.4.3 Fault Mode
      4. 6.4.4 Test Mode and One-Time Programmable Memory
    5. 6.5 Programming
      1. 6.5.1 I2C Communication
        1. 6.5.1.1 I2C Read
        2. 6.5.1.2 I2C Write
  8. 7 Register Map
    1. 7.1 USR_OTP Registers
    2. 7.2 USR_TM Registers
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 External Components
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Bulk Capacitance
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
    5. 8.5 Hall Element Position
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Test Mode and One-Time Programmable Memory

The MC121-Q1 provides a test programming mode where the PWM/DC and FG/RD pins support an I2C interface for device configuration and testing. The I2C interface also gives access to the one-time programmable (OTP) memory in OTP programming mode. Figure 6-29 shows the basic hardware configuration for configuring and programming the MC121-Q1.

MC121-Q1 I2C Programmer and
                    Fan Module Figure 6-29 I2C Programmer and Fan Module

The MC121-Q1 enters test programming mode and OTP programming mode with the following procedure.

  1. Pull the FG/RD pin low and apply a high frequency signal in the range of (416-833) kHz at any duty between (20-80)% for 16 to 20 cycles to the PWM/DC pin to enter the test programming mode. The I2C interface is active in test programming mode.
  2. Communicate with MC121-Q1 over I2C to read and write to the registers in Section 7 to configure the registers to the desired configuration.
  3. To maintain reliable OTP memory programming through I2C communication, maintain the MC121-Q1 power supply pin voltage (VM) above 8V throughout the entire duration of the communication.
  4. Write the OTP programming mode entry key 02h, 01h, 04h to the USR_OTP_PRG_UNLOCK register in successive write-frames to unlock OTP programming mode.
  5. To permanently program the OTP memory, write 1b to the USR_OTP_PROG_ALL bit in USR_OTP_CFG Register.