SLUSCY0C May   2018  – September 2025 BQ27Z561

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Supply Current
    6. 5.6  Internal 1.8V LDO (REG18)
    7. 5.7  I/O (PULS, INT)
    8. 5.8  Chip Enable (CE)
    9. 5.9  Internal Temperature Sensor
    10. 5.10 NTC Thermistor Measurement Support
    11. 5.11 Coulomb Counter (CC)
    12. 5.12 Analog Digital Converter (ADC)
    13. 5.13 Internal Oscillator Specifications
    14. 5.14 Voltage Reference1 (REF1)
    15. 5.15 Voltage Reference2 (REF2)
    16. 5.16 Flash Memory
    17. 5.17 I2C I/O
    18. 5.18 I2C Timing — 100kHz
    19. 5.19 I2C Timing — 400kHz
    20. 5.20 HDQ Timing
    21. 5.21 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1  BQ27Z561 Processor
      2. 6.3.2  Battery Parameter Measurements
        1. 6.3.2.1 Coulomb Counter (CC)
        2. 6.3.2.2 CC Digital Filter
        3. 6.3.2.3 ADC Multiplexer
        4. 6.3.2.4 Analog-to-Digital Converter (ADC)
        5. 6.3.2.5 Internal Temperature Sensor
        6. 6.3.2.6 External Temperature Sensor Support
      3. 6.3.3  Power Supply Control
      4. 6.3.4  Bus Communication Interface
      5. 6.3.5  Low Frequency Oscillator
      6. 6.3.6  High Frequency Oscillator
      7. 6.3.7  1.8V Low Dropout Regulator
      8. 6.3.8  Internal Voltage References
      9. 6.3.9  Gas Gauging
      10. 6.3.10 Charge Control Features
      11. 6.3.11 Authentication
    4. 6.4 Device Functional Modes
      1. 6.4.1 Lifetime Logging Features
      2. 6.4.2 Configuration
        1. 6.4.2.1 Coulomb Counting
        2. 6.4.2.2 Cell Voltage Measurements
        3. 6.4.2.3 Auto Calibration
        4. 6.4.2.4 Temperature Measurements
  8. 7 Applications and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Applications
      1. 7.2.1 Design Requirements (Default)
      2. 7.2.2 Detailed Design Procedure
        1. 7.2.2.1 Changing Design Parameters
      3. 7.2.3 Calibration Process
      4. 7.2.4 Gauging Data Updates
        1. 7.2.4.1 Application Curve
    3. 7.3 Power Supply Requirements
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Third-Party Products Disclaimer
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, Orderable Information

5.20 HDQ Timing

PARAMETERTEST CONDITIONSMINNOMMAXUNIT
tBBreak Time190µs
tBRBreak Recovery Time40µs
tHW1Host Write 1 TimeHost drives HDQ0.550µs
tHW0Host Write 0 TimeHost drives HDQ86145µs
tCYCHCycle Time, Host to deviceDevice drives HDQ190µs
tCYCDCycle Time, device to HostDevice drives HDQ190205250µs
tDW1Device Write 1 TimeDevice drives HDQ3250µs
tDW0Device Write 0 TimeDevice drives HDQ80145µs
tRSPSDevice Response TimeDevice drives HDQ190950µs
tTRNDHost Turn Around TimeHost drives HDQ after device drives HDQ250µs
tRISEHDQ Line Rising Time to Logic 11.8µs
tRSTHDQ ResetHost drives HDQ low before device reset2.2s
BQ27Z561 I2C TimingFigure 5-1 I2C Timing
BQ27Z561 HDQ TimingFigure 5-2 HDQ Timing