SLUSEG7D December   2021  – May 2026 BQ77207

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison Table
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 DC Characteristics
    6. 6.6 Timing Requirements
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Voltage Fault Detection
      2. 7.3.2 Open Wire Fault Detection
      3. 7.3.3 Temperature Fault Detection
      4. 7.3.4 Oscillator Health Check
      5. 7.3.5 Sense Positive Input for Vx
      6. 7.3.6 Output Drive, COUT and DOUT
      7. 7.3.7 The LATCH Function
      8. 7.3.8 Supply Input, VDD
    4. 7.4 Device Functional Modes
      1. 7.4.1 NORMAL Mode
      2. 7.4.2 FAULT Mode
      3. 7.4.3 Customer Test Mode
  9. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Design Requirements
      2. 8.1.2 Detailed Design Procedure
        1. 8.1.2.1 Cell Connection Sequence
    2. 8.2 Systems Example
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Third-Party Products Disclaimer
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Description

The BQ77207 family of products provides a range of voltage and temperature monitoring including overvoltage (OVP), undervoltage (UVP), open wire (OW), and overtemperature (OT) protection for Li-ion battery pack systems. Each cell is monitored independently for overvoltage, undervoltage, and open-wire conditions. With the addition of an external NTC or PTC thermistor, the device can detect overtemperature conditions.

In the BQ77207 device, an internal delay timer is initiated upon detection of an overvoltage, undervoltage, open-wire, or overtemperature condition. Upon expiration of the delay timer, the respective output is triggered into the active state (either high or low, depending on the configuration).

The overvoltage triggers the COUT pin if a fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If an overtemperature or open-wire fault is detected, then both the DOUT and COUT is triggered. For quicker production-line testing, the BQ77207 device provides a Customer Test Mode (CTM) with greatly reduced delay time.

Package Information
PART NUMBER PACKAGE(1) PACKAGE SIZE(2)
BQ77207 DSS (WSON, 12) 3mm × 2mm
For more information, see Section 11.
The package size (length × width) is a nominal value and includes pins, where applicable.
BQ77207 Simplified Schematic Simplified Schematic