SLUSEG7D December   2021  – May 2026 BQ77207

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 DC Characteristics
    6. 6.6 Timing Requirements
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Voltage Fault Detection
      2. 7.3.2 Open Wire Fault Detection
      3. 7.3.3 Temperature Fault Detection
      4. 7.3.4 Oscillator Health Check
      5. 7.3.5 Sense Positive Input for Vx
      6. 7.3.6 Output Drive, COUT and DOUT
      7. 7.3.7 The LATCH Function
      8. 7.3.8 Supply Input, VDD
    4. 7.4 Device Functional Modes
      1. 7.4.1 NORMAL Mode
      2. 7.4.2 FAULT Mode
      3. 7.4.3 Customer Test Mode
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Design Requirements
      2. 8.1.2 Detailed Design Procedure
        1. 8.1.2.1 Cell Connection Sequence
    2. 8.2 Systems Example
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Third-Party Products Disclaimer
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Overview

The BQ77207 family of devices provides a range of voltage and temperature monitoring including overvoltage (OVP), undervoltage (UVP), open wire (OW), and overtemperature (OT) protection for Li-ion battery pack systems. Each cell is monitored independently for overvoltage, undervoltage, and open-wire conditions. With the addition of an external NTC thermistor, the device can detect overtemperature conditions. An internal delay timer is initiated upon detection of an overvoltage, undervoltage, open-wire, or overtemperature condition. Upon expiration of the delay timer, the respective output is triggered into its active state (either high or low depending on the configuration). The overvoltage triggers the COUT pin if a fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If an undertemperature, overtemperature, or open-wire fault is detected, then both the DOUT and COUT are triggered.

For quicker production-line testing, the BQ77207 device provides a Customer Test Mode (CTM) with greatly reduced delay time.