Product details

Function Protection Number of series cells (Min) 3, 4, 5, 6 Number of series cells (Max) 4, 5, 6, 7 Features Overvoltage, Undervoltage, Open wire (OW), Over-temperature (OT), Stackable, FET drive Typical operating current (Typ) (uA) 1 Rating Catalog Vin (Max) (V) 38.5
Function Protection Number of series cells (Min) 3, 4, 5, 6 Number of series cells (Max) 4, 5, 6, 7 Features Overvoltage, Undervoltage, Open wire (OW), Over-temperature (OT), Stackable, FET drive Typical operating current (Typ) (uA) 1 Rating Catalog Vin (Max) (V) 38.5
WSON (DSS) 12 6 mm² 3 x 2
  • 3-series cell to 7-series cell protection
  • High-accuracy overvoltage protection
    • ± 10 mV at 25°C
    • ± 20 mV from 0°C to 60°C
  • Overvoltage protection options from 3.55 V to 5.1 V
  • Undervoltage protection with options from 1.0 V to 3.5 V
  • Open-wire connection detection
  • Overtemperature protection using NTC or PTC
  • Random cell connection
  • Functional safety-capable
  • Fixed internal delay timers
  • Fixed detections thresholds
  • Fixed output drive type for each of COUT and DOUT
    • Active high or active low
    • Active high drive to 6 V
    • Open drain with ability to be pulled up externally to VDD
  • Low power consumption ICC ≈ 1 µA (VCELL(ALL) < VOV)
  • Low leakage current per cell input < 100 nA with open-wire detection disabled
  • Package footprint option
    • 12-pin WSON with 0.5-mm lead pitch
  • 3-series cell to 7-series cell protection
  • High-accuracy overvoltage protection
    • ± 10 mV at 25°C
    • ± 20 mV from 0°C to 60°C
  • Overvoltage protection options from 3.55 V to 5.1 V
  • Undervoltage protection with options from 1.0 V to 3.5 V
  • Open-wire connection detection
  • Overtemperature protection using NTC or PTC
  • Random cell connection
  • Functional safety-capable
  • Fixed internal delay timers
  • Fixed detections thresholds
  • Fixed output drive type for each of COUT and DOUT
    • Active high or active low
    • Active high drive to 6 V
    • Open drain with ability to be pulled up externally to VDD
  • Low power consumption ICC ≈ 1 µA (VCELL(ALL) < VOV)
  • Low leakage current per cell input < 100 nA with open-wire detection disabled
  • Package footprint option
    • 12-pin WSON with 0.5-mm lead pitch

The BQ77207 family of products provides a range of voltage and temperature monitoring including overvoltage (OVP), undervoltage (UVP), open wire (OW), and overtemperature (OT) protection for Li-ion battery pack systems. Each cell is monitored independently for overvoltage, undervoltage, and open-wire conditions. With the addition of an external NTC or PTC thermistor, the device can detect overtemperature conditions.

In the BQ77207 device, an internal delay timer is initiated upon detection of an overvoltage, undervoltage, open-wire, or overtemperature condition. Upon expiration of the delay timer, the respective output is triggered into its active state (either high or low, depending on the configuration).

The overvoltage triggers the COUT pin if a fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If an overtemperature or open-wire fault is detected, then both the DOUT and COUT will be triggered. For quicker production-line testing, the BQ77207 device provides a Customer Test Mode (CTM) with greatly reduced delay time.

The BQ77207 family of products provides a range of voltage and temperature monitoring including overvoltage (OVP), undervoltage (UVP), open wire (OW), and overtemperature (OT) protection for Li-ion battery pack systems. Each cell is monitored independently for overvoltage, undervoltage, and open-wire conditions. With the addition of an external NTC or PTC thermistor, the device can detect overtemperature conditions.

In the BQ77207 device, an internal delay timer is initiated upon detection of an overvoltage, undervoltage, open-wire, or overtemperature condition. Upon expiration of the delay timer, the respective output is triggered into its active state (either high or low, depending on the configuration).

The overvoltage triggers the COUT pin if a fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If an overtemperature or open-wire fault is detected, then both the DOUT and COUT will be triggered. For quicker production-line testing, the BQ77207 device provides a Customer Test Mode (CTM) with greatly reduced delay time.

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Technical documentation

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Type Title Date
* Data sheet BQ77207 Voltage and Temperature Protection for 3-Series to 7-Series Cell Li-Ion Batteries with Internal Delay Timer datasheet 05 Jan 2021
Functional safety information BQ77207 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMA 20 Dec 2021
User guide BQ77207EVM User's Guide 28 Oct 2021
Certificate BQ77207EVM EU RoHS Declaration of Conformity (DoC) 26 Aug 2021

Design & development

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Evaluation board

BQ77207EVM — BQ77207 evaluation module 3-series to 7-series cell Li-ion battery voltage and temperature protector

The BQ77207EVM evaluation module (EVM) is a complete evaluation system for the BQ77207, a 3-series to 7-series cell Li-Ion battery protection integrated circuit.  The circuit module includes one BQ77207 integrated circuit (IC), thermistor, and all other onboard components necessary to signal (...)

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WSON (DSS) 12 View options

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