SLUUBY2B September   2020  – May 2022 BQ76952

 

  1.   Read This First
    1.     Battery Notational Conventions
    2.     Trademarks
    3.     Glossary
  2. Introduction
  3. Device Description
    1. 2.1 Overview
    2. 2.2 Functional Block Diagram
  4. Device Configuration
    1. 3.1 Direct Commands and Subcommands
    2. 3.2 Configuration Using OTP or Registers
    3. 3.3 Data Formats
      1. 3.3.1 Unsigned Integer
      2. 3.3.2 Integer
      3. 3.3.3 Floating Point
      4. 3.3.4 Hex
  5. Measurement Subsystem
    1. 4.1  Voltage Measurement
      1. 4.1.1 Voltage Measurement Schedule
      2. 4.1.2 Usage of VC Pins for Cells Versus Interconnect
      3. 4.1.3 Cell Interconnect Resistance
    2. 4.2  General Purpose ADCIN Functionality
    3. 4.3  Coulomb Counter and Digital Filters
    4. 4.4  Synchronized Voltage and Current Measurement
    5. 4.5  Subcommands 0x0071–0x0074 DASTATUS1-4(), Cell Voltage and Synchronized Current Counts
    6. 4.6  Subcommands 0x0075–0x0077 DASTATUS5–7(), Additional Measurements
    7. 4.7  Internal Temperature Measurement
    8. 4.8  Thermistor Temperature Measurement
    9. 4.9  Factory Trim of Voltage ADC
    10. 4.10 Voltage Calibration (ADC Measurements)
    11. 4.11 Voltage Calibration (COV and CUV Protections)
    12. 4.12 Current Calibration
    13. 4.13 Temperature Calibration
  6. Primary and Secondary Protection Subsystems
    1. 5.1 Protections Overview
    2. 5.2 Primary Protections
      1. 5.2.1  Primary Protections Overview
      2. 5.2.2  High-Side NFET Drivers
      3. 5.2.3  Protection FETs Configuration and Control
        1. 5.2.3.1 FET Configuration
        2. 5.2.3.2 FET Control
          1. 5.2.3.2.1 PRECHARGE Mode
          2. 5.2.3.2.2 PREDISCHARGE Mode
      4. 5.2.4  Cell Overvoltage Protection
      5. 5.2.5  Cell Undervoltage Protection
      6. 5.2.6  Short Circuit in Discharge Protection
      7. 5.2.7  Overcurrent in Charge Protection
      8. 5.2.8  Overcurrent in Discharge 1, 2, and 3 Protections
      9. 5.2.9  Overtemperature in Charge Protection
      10. 5.2.10 Overtemperature in Discharge Protection
      11. 5.2.11 Overtemperature FET Protection
      12. 5.2.12 Internal Overtemperature Protection
      13. 5.2.13 Undertemperature in Charge Protection
      14. 5.2.14 Undertemperature in Discharge Protection
      15. 5.2.15 Internal Undertemperature Protection
      16. 5.2.16 Host Watchdog Protection
      17. 5.2.17 Precharge Timeout Protection
      18. 5.2.18 Load Detect Functionality
    3. 5.3 Secondary Protections
      1. 5.3.1  Secondary Protections Overview
      2. 5.3.2  Copper Deposition (CUDEP) Permanent Fail
      3. 5.3.3  Safety Undervoltage (SUV) Permanent Fail
      4. 5.3.4  Safety Overvoltage (SOV) Permanent Fail
      5. 5.3.5  Safety Overcurrent in Charge (SOCC) Permanent Fail
      6. 5.3.6  Safety Overcurrent in Discharge (SOCD) Permanent Fail
      7. 5.3.7  Safety Cell Overtemperature (SOT) Permanent Fail
      8. 5.3.8  Safety FET Overtemperature (SOTF) Permanent Fail
      9. 5.3.9  Charge FET (CFETF) Permanent Fail
      10. 5.3.10 Discharge FET (DFETF) Permanent Fail
      11. 5.3.11 Secondary Protector (2LVL) Permanent Fail
      12. 5.3.12 Voltage Imbalance in Relax (VIMR) Permanent Fail
      13. 5.3.13 Voltage Imbalance in Active (VIMA) Permanent Fail
      14. 5.3.14 Short Circuit in Discharge Latched Permanent Fail
      15. 5.3.15 OTP Memory Signature Permanent Fail
      16. 5.3.16 Data ROM Memory Signature Permanent Fail
      17. 5.3.17 Instruction ROM Memory Signature Permanent Fail
      18. 5.3.18 LFO Oscillator Permanent Fail
      19. 5.3.19 Voltage Reference Permanent Fail
      20. 5.3.20 VSS Permanent Fail
      21. 5.3.21 Protection Comparator MUX Permanent Fail
      22. 5.3.22 Commanded Permanent Fail
      23. 5.3.23 Top of Stack Measurement Check
      24. 5.3.24 Cell Open Wire
  7. Device Status and Controls
    1. 6.1 0x00 Control Status() and 0x12 Battery Status() Commands
    2. 6.2 0x0070 MANU_DATA() Subcommand
    3. 6.3 LDOs
      1. 6.3.1 Preregulator Control
      2. 6.3.2 REG1 and REG2 LDO Controls
    4. 6.4 Multifunction Pin Controls
    5. 6.5 CFETOFF, DFETOFF, and BOTHOFF Pin Functionality
    6. 6.6 ALERT Pin Operation
    7. 6.7 DDSG and DCHG Pin Operation
    8. 6.8 Fuse Drive
    9. 6.9 Device Event Timing
  8. Operational Modes
    1. 7.1 Overview
    2. 7.2 NORMAL Mode
    3. 7.3 SLEEP Mode
    4. 7.4 DEEPSLEEP Mode
    5. 7.5 SHUTDOWN Mode
    6. 7.6 CONFIG_UPDATE Mode
  9. Device Security
    1. 8.1 Overview
  10. Serial Communications Interfaces
    1. 9.1 Serial Communications Overview
    2. 9.2 I2C Communications Subsystem
    3. 9.3 SPI Communications Interface
      1. 9.3.1 SPI Protocol
    4. 9.4 HDQ Communications Interface
  11. 10Cell Balancing
    1. 10.1 Cell Balancing Operation
    2. 10.2 Cell Balancing Timing
  12. 11Diagnostics
    1. 11.1 Diagnostics Overview
    2. 11.2 VREF2 Versus VREF1 Check
    3. 11.3 VSS Measurement
    4. 11.4 Top of Stack Measurement Check
    5. 11.5 LFO Oscillator Monitor
    6. 11.6 Protection Comparator Mux Check
    7. 11.7 Internal Watchdog Reset
    8. 11.8 Internal Memory Checks
  13. 12Commands and Subcommands
    1. 12.1 Direct Commands
    2. 12.2 Bitfield Definitions for Direct Commands
      1. 12.2.1  Control Status Register
      2. 12.2.2  Safety Alert A Register
      3. 12.2.3  Safety Status A Register
      4. 12.2.4  Safety Alert B Register
      5. 12.2.5  Safety Status B Register
      6. 12.2.6  Safety Alert C Register
      7. 12.2.7  Safety Status C Register
      8. 12.2.8  PF Alert A Register
      9. 12.2.9  PF Status A Register
      10. 12.2.10 PF Alert B Register
      11. 12.2.11 PF Status B Register
      12. 12.2.12 PF Alert C Register
      13. 12.2.13 PF Status C Register
      14. 12.2.14 PF Alert D Register
      15. 12.2.15 PF Status D Register
      16. 12.2.16 Battery Status Register
      17. 12.2.17 Alarm Status Register
      18. 12.2.18 Alarm Raw Status Register
      19. 12.2.19 Alarm Enable Register
      20. 12.2.20 FET Status Register
    3. 12.3 Command-Only Subcommands
    4. 12.4 Subcommands with Data
    5. 12.5 Bitfield Definitions for Subcommands
      1. 12.5.1 PF Status A Register
      2. 12.5.2 PF Status B Register
      3. 12.5.3 PF Status C Register
      4. 12.5.4 PF Status D Register
      5. 12.5.5 Manufacturing Status Register
      6. 12.5.6 FET Control Register
      7. 12.5.7 REG12 Control Register
      8. 12.5.8 OTP Write Check Result Register
      9. 12.5.9 OTP Write Result Register
  14. 13Data Memory Settings
    1. 13.1 Data Memory Access
    2. 13.2 Calibration
      1. 13.2.1  Calibration:Voltage
        1. 13.2.1.1  Calibration:Voltage:Cell 1 Gain
        2. 13.2.1.2  Calibration:Voltage:Cell 2 Gain
        3. 13.2.1.3  Calibration:Voltage:Cell 3 Gain
        4. 13.2.1.4  Calibration:Voltage:Cell 4 Gain
        5. 13.2.1.5  Calibration:Voltage:Cell 5 Gain
        6. 13.2.1.6  Calibration:Voltage:Cell 6 Gain
        7. 13.2.1.7  Calibration:Voltage:Cell 7 Gain
        8. 13.2.1.8  Calibration:Voltage:Cell 8 Gain
        9. 13.2.1.9  Calibration:Voltage:Cell 9 Gain
        10. 13.2.1.10 Calibration:Voltage:Cell 10 Gain
        11. 13.2.1.11 Calibration:Voltage:Cell 11 Gain
        12. 13.2.1.12 Calibration:Voltage:Cell 12 Gain
        13. 13.2.1.13 Calibration:Voltage:Cell 13 Gain
        14. 13.2.1.14 Calibration:Voltage:Cell 14 Gain
        15. 13.2.1.15 Calibration:Voltage:Cell 15 Gain
        16. 13.2.1.16 Calibration:Voltage:Cell 16 Gain
        17. 13.2.1.17 Calibration:Voltage:Pack Gain
        18. 13.2.1.18 Calibration:Voltage:TOS Gain
        19. 13.2.1.19 Calibration:Voltage:LD Gain
        20. 13.2.1.20 Calibration:Voltage:ADC Gain
      2. 13.2.2  Calibration:Current
        1. 13.2.2.1 Calibration:Current:CC Gain
        2. 13.2.2.2 Calibration:Current:Capacity Gain
      3. 13.2.3  Calibration:Vcell Offset
        1. 13.2.3.1 Calibration:Vcell Offset:Vcell Offset
      4. 13.2.4  Calibration:V Divider Offset
        1. 13.2.4.1 Calibration:V Divider Offset:Vdiv Offset
      5. 13.2.5  Calibration:Current Offset
        1. 13.2.5.1 Calibration:Current Offset:Coulomb Counter Offset Samples
        2. 13.2.5.2 Calibration:Current Offset:Board Offset
      6. 13.2.6  Calibration:Temperature
        1. 13.2.6.1  Calibration:Temperature:Internal Temp Offset
        2. 13.2.6.2  Calibration:Temperature:CFETOFF Temp Offset
        3. 13.2.6.3  Calibration:Temperature:DFETOFF Temp Offset
        4. 13.2.6.4  Calibration:Temperature:ALERT Temp Offset
        5. 13.2.6.5  Calibration:Temperature:TS1 Temp Offset
        6. 13.2.6.6  Calibration:Temperature:TS2 Temp Offset
        7. 13.2.6.7  Calibration:Temperature:TS3 Temp Offset
        8. 13.2.6.8  Calibration:Temperature:HDQ Temp Offset
        9. 13.2.6.9  Calibration:Temperature:DCHG Temp Offset
        10. 13.2.6.10 Calibration:Temperature:DDSG Temp Offset
      7. 13.2.7  Calibration:Internal Temp Model
        1. 13.2.7.1 Calibration:Internal Temp Model:Int Gain
        2. 13.2.7.2 Calibration:Internal Temp Model:Int base offset
        3. 13.2.7.3 Calibration:Internal Temp Model:Int Maximum AD
        4. 13.2.7.4 Calibration:Internal Temp Model:Int Maximum Temp
      8. 13.2.8  Calibration:18K Temperature Model
        1. 13.2.8.1  Calibration:18K Temperature Model:Coeff a1
        2. 13.2.8.2  Calibration:18K Temperature Model:Coeff a2
        3. 13.2.8.3  Calibration:18K Temperature Model:Coeff a3
        4. 13.2.8.4  Calibration:18K Temperature Model:Coeff a4
        5. 13.2.8.5  Calibration:18K Temperature Model:Coeff a5
        6. 13.2.8.6  Calibration:18K Temperature Model:Coeff b1
        7. 13.2.8.7  Calibration:18K Temperature Model:Coeff b2
        8. 13.2.8.8  Calibration:18K Temperature Model:Coeff b3
        9. 13.2.8.9  Calibration:18K Temperature Model:Coeff b4
        10. 13.2.8.10 Calibration:18K Temperature Model:Adc0
      9. 13.2.9  Calibration:180K Temperature Model
        1. 13.2.9.1  Calibration:180K Temperature Model:Coeff a1
        2. 13.2.9.2  Calibration:180K Temperature Model:Coeff a2
        3. 13.2.9.3  Calibration:180K Temperature Model:Coeff a3
        4. 13.2.9.4  Calibration:180K Temperature Model:Coeff a4
        5. 13.2.9.5  Calibration:180K Temperature Model:Coeff a5
        6. 13.2.9.6  Calibration:180K Temperature Model:Coeff b1
        7. 13.2.9.7  Calibration:180K Temperature Model:Coeff b2
        8. 13.2.9.8  Calibration:180K Temperature Model:Coeff b3
        9. 13.2.9.9  Calibration:180K Temperature Model:Coeff b4
        10. 13.2.9.10 Calibration:180K Temperature Model:Adc0
      10. 13.2.10 Calibration:Custom Temperature Model
        1. 13.2.10.1  Calibration:Custom Temperature Model:Coeff a1
        2. 13.2.10.2  Calibration:Custom Temperature Model:Coeff a2
        3. 13.2.10.3  Calibration:Custom Temperature Model:Coeff a3
        4. 13.2.10.4  Calibration:Custom Temperature Model:Coeff a4
        5. 13.2.10.5  Calibration:Custom Temperature Model:Coeff a5
        6. 13.2.10.6  Calibration:Custom Temperature Model:Coeff b1
        7. 13.2.10.7  Calibration:Custom Temperature Model:Coeff b2
        8. 13.2.10.8  Calibration:Custom Temperature Model:Coeff b3
        9. 13.2.10.9  Calibration:Custom Temperature Model:Coeff b4
        10. 13.2.10.10 Calibration:Custom Temperature Model:Rc0
        11. 13.2.10.11 Calibration:Custom Temperature Model:Adc0
      11. 13.2.11 Calibration:Current Deadband
        1. 13.2.11.1 Calibration:Current Deadband:Coulomb Counter Deadband
      12. 13.2.12 Calibration:CUV
        1. 13.2.12.1 Calibration:CUV:CUV Threshold Override
      13. 13.2.13 Calibration:COV
        1. 13.2.13.1 Calibration:COV:COV Threshold Override
    3. 13.3 Settings
      1. 13.3.1  Settings:Fuse
        1. 13.3.1.1 Settings:Fuse:Min Blow Fuse Voltage
        2. 13.3.1.2 Settings:Fuse:Fuse Blow Timeout
      2. 13.3.2  Settings:Configuration
        1. 13.3.2.1  Settings:Configuration:Power Config
        2. 13.3.2.2  Settings:Configuration:REG12 Config
        3. 13.3.2.3  Settings:Configuration:REG0 Config
        4. 13.3.2.4  Settings:Configuration:HWD Regulator Options
        5. 13.3.2.5  Settings:Configuration:Comm Type
        6. 13.3.2.6  Settings:Configuration:I2C Address
        7. 13.3.2.7  Settings:Configuration:SPI Configuration
        8. 13.3.2.8  Settings:Configuration:Comm Idle Time
        9. 13.3.2.9  Settings:Configuration:CFETOFF Pin Config
        10. 13.3.2.10 Settings:Configuration:DFETOFF Pin Config
        11. 13.3.2.11 Settings:Configuration:ALERT Pin Config
        12. 13.3.2.12 Settings:Configuration:TS1 Config
        13. 13.3.2.13 Settings:Configuration:TS2 Config
        14. 13.3.2.14 Settings:Configuration:TS3 Config
        15. 13.3.2.15 Settings:Configuration:HDQ Pin Config
        16. 13.3.2.16 Settings:Configuration:DCHG Pin Config
        17. 13.3.2.17 Settings:Configuration:DDSG Pin Config
        18. 13.3.2.18 Settings:Configuration:DA Configuration
        19. 13.3.2.19 Settings:Configuration:Vcell Mode
        20. 13.3.2.20 Settings:Configuration:CC3 Samples
      3. 13.3.3  Settings:Protection
        1. 13.3.3.1  Settings:Protection:Protection Configuration
        2. 13.3.3.2  Settings:Protection:Enabled Protections A
        3. 13.3.3.3  Settings:Protection:Enabled Protections B
        4. 13.3.3.4  Settings:Protection:Enabled Protections C
        5. 13.3.3.5  Settings:Protection:CHG FET Protections A
        6. 13.3.3.6  Settings:Protection:CHG FET Protections B
        7. 13.3.3.7  Settings:Protection:CHG FET Protections C
        8. 13.3.3.8  Settings:Protection:DSG FET Protections A
        9. 13.3.3.9  Settings:Protection:DSG FET Protections B
        10. 13.3.3.10 Settings:Protection:DSG FET Protections C
        11. 13.3.3.11 Settings:Protection:Body Diode Threshold
      4. 13.3.4  Settings:Alarm
        1. 13.3.4.1 Settings:Alarm:Default Alarm Mask
        2. 13.3.4.2 Settings:Alarm:SF Alert Mask A
        3. 13.3.4.3 Settings:Alarm:SF Alert Mask B
        4. 13.3.4.4 Settings:Alarm:SF Alert Mask C
        5. 13.3.4.5 Settings:Alarm:PF Alert Mask A
        6. 13.3.4.6 Settings:Alarm:PF Alert Mask B
        7. 13.3.4.7 Settings:Alarm:PF Alert Mask C
        8. 13.3.4.8 Settings:Alarm:PF Alert Mask D
      5. 13.3.5  Settings:Permanent Failure
        1. 13.3.5.1 Settings:Permanent Failure:Enabled PF A
        2. 13.3.5.2 Settings:Permanent Failure:Enabled PF B
        3. 13.3.5.3 Settings:Permanent Failure:Enabled PF C
        4. 13.3.5.4 Settings:Permanent Failure:Enabled PF D
      6. 13.3.6  Settings:FET
        1. 13.3.6.1 Settings:FET:FET Options
        2. 13.3.6.2 Settings:FET:Chg Pump Control
        3. 13.3.6.3 Settings:FET:Precharge Start Voltage
        4. 13.3.6.4 Settings:FET:Precharge Stop Voltage
        5. 13.3.6.5 Settings:FET:Predischarge Timeout
        6. 13.3.6.6 Settings:FET:Predischarge Stop Delta
      7. 13.3.7  Settings:Current Thresholds
        1. 13.3.7.1 Settings:Current Thresholds:Dsg Current Threshold
        2. 13.3.7.2 Settings:Current Thresholds:Chg Current Threshold
      8. 13.3.8  Settings:Cell Open-Wire
        1. 13.3.8.1 Settings:Cell Open-Wire:Check Time
      9. 13.3.9  Settings:Interconnect Resistances
        1. 13.3.9.1  Settings:Interconnect Resistances:Cell 1 Interconnect
        2. 13.3.9.2  Settings:Interconnect Resistances:Cell 2 Interconnect
        3. 13.3.9.3  Settings:Interconnect Resistances:Cell 3 Interconnect
        4. 13.3.9.4  Settings:Interconnect Resistances:Cell 4 Interconnect
        5. 13.3.9.5  Settings:Interconnect Resistances:Cell 5 Interconnect
        6. 13.3.9.6  Settings:Interconnect Resistances:Cell 6 Interconnect
        7. 13.3.9.7  Settings:Interconnect Resistances:Cell 7 Interconnect
        8. 13.3.9.8  Settings:Interconnect Resistances:Cell 8 Interconnect
        9. 13.3.9.9  Settings:Interconnect Resistances:Cell 9 Interconnect
        10. 13.3.9.10 Settings:Interconnect Resistances:Cell 10 Interconnect
        11. 13.3.9.11 Settings:Interconnect Resistances:Cell 11 Interconnect
        12. 13.3.9.12 Settings:Interconnect Resistances:Cell 12 Interconnect
        13. 13.3.9.13 Settings:Interconnect Resistances:Cell 13 Interconnect
        14. 13.3.9.14 Settings:Interconnect Resistances:Cell 14 Interconnect
        15. 13.3.9.15 Settings:Interconnect Resistances:Cell 15 Interconnect
        16. 13.3.9.16 Settings:Interconnect Resistances:Cell 16 Interconnect
      10. 13.3.10 Settings:Manufacturing
        1. 13.3.10.1 Settings:Manufacturing:Mfg Status Init
      11. 13.3.11 Settings:Cell Balancing Config
        1. 13.3.11.1  Settings:Cell Balancing Config:Balancing Configuration
        2. 13.3.11.2  Settings:Cell Balancing Config:Min Cell Temp
        3. 13.3.11.3  Settings:Cell Balancing Config:Max Cell Temp
        4. 13.3.11.4  Settings:Cell Balancing Config:Max Internal Temp
        5. 13.3.11.5  Settings:Cell Balancing Config:Cell Balance Interval
        6. 13.3.11.6  Settings:Cell Balancing Config:Cell Balance Max Cells
        7. 13.3.11.7  Settings:Cell Balancing Config:Cell Balance Min Cell V (Charge)
        8. 13.3.11.8  Settings:Cell Balancing Config:Cell Balance Min Delta (Charge)
        9. 13.3.11.9  Settings:Cell Balancing Config:Cell Balance Stop Delta (Charge)
        10. 13.3.11.10 Settings:Cell Balancing Config:Cell Balance Min Cell V (Relax)
        11. 13.3.11.11 Settings:Cell Balancing Config:Cell Balance Min Delta (Relax)
        12. 13.3.11.12 Settings:Cell Balancing Config:Cell Balance Stop Delta (Relax)
    4. 13.4 Power
      1. 13.4.1 Power:Shutdown
        1. 13.4.1.1 Power:Shutdown:Shutdown Cell Voltage
        2. 13.4.1.2 Power:Shutdown:Shutdown Stack Voltage
        3. 13.4.1.3 Power:Shutdown:Low V Shutdown Delay
        4. 13.4.1.4 Power:Shutdown:Shutdown Temperature
        5. 13.4.1.5 Power:Shutdown:Shutdown Temperature Delay
        6. 13.4.1.6 Power:Shutdown:FET Off Delay
        7. 13.4.1.7 Power:Shutdown:Shutdown Command Delay
        8. 13.4.1.8 Power:Shutdown:Auto Shutdown Time
        9. 13.4.1.9 Power:Shutdown:RAM Fail Shutdown Time
      2. 13.4.2 Power:Sleep
        1. 13.4.2.1 Power:Sleep:Sleep Current
        2. 13.4.2.2 Power:Sleep:Voltage Time
        3. 13.4.2.3 Power:Sleep:Wake Comparator Current
        4. 13.4.2.4 Power:Sleep:Sleep Hysteresis Time
        5. 13.4.2.5 Power:Sleep:Sleep Charger Voltage Threshold
        6. 13.4.2.6 Power:Sleep:Sleep Charger PACK-TOS Delta
    5. 13.5 System Data
      1. 13.5.1 System Data:Integrity
        1. 13.5.1.1 System Data:Integrity:Config RAM Signature
    6. 13.6 Protections
      1. 13.6.1  Protections:CUV
        1. 13.6.1.1 Protections:CUV:Threshold
        2. 13.6.1.2 Protections:CUV:Delay
        3. 13.6.1.3 Protections:CUV:Recovery Hysteresis
      2. 13.6.2  Protections:COV
        1. 13.6.2.1 Protections:COV:Threshold
        2. 13.6.2.2 Protections:COV:Delay
        3. 13.6.2.3 Protections:COV:Recovery Hysteresis
      3. 13.6.3  Protections:COVL
        1. 13.6.3.1 Protections:COVL:Latch Limit
        2. 13.6.3.2 Protections:COVL:Counter Dec Delay
        3. 13.6.3.3 Protections:COVL:Recovery Time
      4. 13.6.4  Protections:OCC
        1. 13.6.4.1 Protections:OCC:Threshold
        2. 13.6.4.2 Protections:OCC:Delay
        3. 13.6.4.3 Protections:OCC:Recovery Threshold
        4. 13.6.4.4 Protections:OCC:PACK-TOS Delta
      5. 13.6.5  Protections:OCD1
        1. 13.6.5.1 Protections:OCD1:Threshold
        2. 13.6.5.2 Protections:OCD1:Delay
      6. 13.6.6  Protections:OCD2
        1. 13.6.6.1 Protections:OCD2:Threshold
        2. 13.6.6.2 Protections:OCD2:Delay
      7. 13.6.7  Protections:SCD
        1. 13.6.7.1 Protections:SCD:Threshold
        2. 13.6.7.2 Protections:SCD:Delay
        3. 13.6.7.3 Protections:SCD:Recovery Time
      8. 13.6.8  Protections:OCD3
        1. 13.6.8.1 Protections:OCD3:Threshold
        2. 13.6.8.2 Protections:OCD3:Delay
      9. 13.6.9  Protections:OCD
        1. 13.6.9.1 Protections:OCD:Recovery Threshold
      10. 13.6.10 Protections:OCDL
        1. 13.6.10.1 Protections:OCDL:Latch Limit
        2. 13.6.10.2 Protections:OCDL:Counter Dec Delay
        3. 13.6.10.3 Protections:OCDL:Recovery Time
        4. 13.6.10.4 Protections:OCDL:Recovery Threshold
      11. 13.6.11 Protections:SCDL
        1. 13.6.11.1 Protections:SCDL:Latch Limit
        2. 13.6.11.2 Protections:SCDL:Counter Dec Delay
        3. 13.6.11.3 Protections:SCDL:Recovery Time
        4. 13.6.11.4 Protections:SCDL:Recovery Threshold
      12. 13.6.12 Protections:OTC
        1. 13.6.12.1 Protections:OTC:Threshold
        2. 13.6.12.2 Protections:OTC:Delay
        3. 13.6.12.3 Protections:OTC:Recovery
      13. 13.6.13 Protections:OTD
        1. 13.6.13.1 Protections:OTD:Threshold
        2. 13.6.13.2 Protections:OTD:Delay
        3. 13.6.13.3 Protections:OTD:Recovery
      14. 13.6.14 Protections:OTF
        1. 13.6.14.1 Protections:OTF:Threshold
        2. 13.6.14.2 Protections:OTF:Delay
        3. 13.6.14.3 Protections:OTF:Recovery
      15. 13.6.15 Protections:OTINT
        1. 13.6.15.1 Protections:OTINT:Threshold
        2. 13.6.15.2 Protections:OTINT:Delay
        3. 13.6.15.3 Protections:OTINT:Recovery
      16. 13.6.16 Protections:UTC
        1. 13.6.16.1 Protections:UTC:Threshold
        2. 13.6.16.2 Protections:UTC:Delay
        3. 13.6.16.3 Protections:UTC:Recovery
      17. 13.6.17 Protections:UTD
        1. 13.6.17.1 Protections:UTD:Threshold
        2. 13.6.17.2 Protections:UTD:Delay
        3. 13.6.17.3 Protections:UTD:Recovery
      18. 13.6.18 Protections:UTINT
        1. 13.6.18.1 Protections:UTINT:Threshold
        2. 13.6.18.2 Protections:UTINT:Delay
        3. 13.6.18.3 Protections:UTINT:Recovery
      19. 13.6.19 Protections:Recovery
        1. 13.6.19.1 Protections:Recovery:Time
      20. 13.6.20 Protections:HWD
        1. 13.6.20.1 Protections:HWD:Delay
      21. 13.6.21 Protections:Load Detect
        1. 13.6.21.1 Protections:Load Detect:Active Time
        2. 13.6.21.2 Protections:Load Detect:Retry Delay
        3. 13.6.21.3 Protections:Load Detect:Timeout
      22. 13.6.22 Protections:PTO
        1. 13.6.22.1 Protections:PTO:Charge Threshold
        2. 13.6.22.2 Protections:PTO:Delay
        3. 13.6.22.3 Protections:PTO:Reset
    7. 13.7 Permanent Fail
      1. 13.7.1  Permanent Fail:CUDEP
        1. 13.7.1.1 Permanent Fail:CUDEP:Threshold
        2. 13.7.1.2 Permanent Fail:CUDEP:Delay
      2. 13.7.2  Permanent Fail:SUV
        1. 13.7.2.1 Permanent Fail:SUV:Threshold
        2. 13.7.2.2 Permanent Fail:SUV:Delay
      3. 13.7.3  Permanent Fail:SOV
        1. 13.7.3.1 Permanent Fail:SOV:Threshold
        2. 13.7.3.2 Permanent Fail:SOV:Delay
      4. 13.7.4  Permanent Fail:TOS
        1. 13.7.4.1 Permanent Fail:TOS:Threshold
        2. 13.7.4.2 Permanent Fail:TOS:Delay
      5. 13.7.5  Permanent Fail:SOCC
        1. 13.7.5.1 Permanent Fail:SOCC:Threshold
        2. 13.7.5.2 Permanent Fail:SOCC:Delay
      6. 13.7.6  Permanent Fail:SOCD
        1. 13.7.6.1 Permanent Fail:SOCD:Threshold
        2. 13.7.6.2 Permanent Fail:SOCD:Delay
      7. 13.7.7  Permanent Fail:SOT
        1. 13.7.7.1 Permanent Fail:SOT:Threshold
        2. 13.7.7.2 Permanent Fail:SOT:Delay
      8. 13.7.8  Permanent Fail:SOTF
        1. 13.7.8.1 Permanent Fail:SOTF:Threshold
        2. 13.7.8.2 Permanent Fail:SOTF:Delay
      9. 13.7.9  Permanent Fail:VIMR
        1. 13.7.9.1 Permanent Fail:VIMR:Check Voltage
        2. 13.7.9.2 Permanent Fail:VIMR:Max Relax Current
        3. 13.7.9.3 Permanent Fail:VIMR:Threshold
        4. 13.7.9.4 Permanent Fail:VIMR:Delay
        5. 13.7.9.5 Permanent Fail:VIMR:Relax Min Duration
      10. 13.7.10 Permanent Fail:VIMA
        1. 13.7.10.1 Permanent Fail:VIMA:Check Voltage
        2. 13.7.10.2 Permanent Fail:VIMA:Min Active Current
        3. 13.7.10.3 Permanent Fail:VIMA:Threshold
        4. 13.7.10.4 Permanent Fail:VIMA:Delay
      11. 13.7.11 Permanent Fail:CFETF
        1. 13.7.11.1 Permanent Fail:CFETF:OFF Threshold
        2. 13.7.11.2 Permanent Fail:CFETF:OFF Delay
      12. 13.7.12 Permanent Fail:DFETF
        1. 13.7.12.1 Permanent Fail:DFETF:OFF Threshold
        2. 13.7.12.2 Permanent Fail:DFETF:OFF Delay
      13. 13.7.13 Permanent Fail:VSSF
        1. 13.7.13.1 Permanent Fail:VSSF:Fail Threshold
        2. 13.7.13.2 Permanent Fail:VSSF:Delay
      14. 13.7.14 Permanent Fail:2LVL
        1. 13.7.14.1 Permanent Fail:2LVL:Delay
      15. 13.7.15 Permanent Fail:LFOF
        1. 13.7.15.1 Permanent Fail:LFOF:Delay
      16. 13.7.16 Permanent Fail:HWMX
        1. 13.7.16.1 Permanent Fail:HWMX:Delay
    8. 13.8 Security
      1. 13.8.1 Security:Settings
        1. 13.8.1.1 Security:Settings:Security Settings
      2. 13.8.2 Security:Keys
        1. 13.8.2.1 Security:Keys:Unseal Key Step 1
        2. 13.8.2.2 Security:Keys:Unseal Key Step 2
        3. 13.8.2.3 Security:Keys:Full Access Key Step 1
        4. 13.8.2.4 Security:Keys:Full Access Key Step 2
    9. 13.9 Data Memory Summary
  15. 15Revision History

SLEEP Mode

SLEEP mode is a reduced functionality state that can be optionally used to reduce power dissipation when there is little or no system load current or charging in progress, but still provides voltage at the battery pack terminals to keep the system alive. At initial power up, the Settings:Configuration:Power Config[SLEEP] configuration bit determines whether the device can enter SLEEP mode. After initialization, SLEEP mode can be allowed or disallowed using the 0x0099 SLEEP_ENABLE() and 0x009A SLEEP_DISABLE() subcommands. The 0x12 Battery Status()[SLEEP_EN] bit indicates whether the device is presently allowed to enter SLEEP mode or not, while the 0x12 Battery Status()[SLEEP] bit indicates whether it is presently in SLEEP mode or not.

When the magnitude of the CC1 Current measurement falls below a current threshold given by Power:Sleep:Sleep Current, the system is considered in RELAX mode, and the BQ76952 device autonomously transitions into SLEEP mode, if settings permit. During SLEEP mode, comparator-based protections operate the same as during NORMAL mode. ADC-based current, voltage, and temperature measurements are taken every Power:Sleep:Voltage Time seconds. While in SLEEP mode, the device also begins a 4-s, low-power current measurement 1 s—after completing voltage and temperature measurements—which is used for accumulated charge integration while in SLEEP mode. When the Power:Sleep:Voltage Time timer expires and a set of measurements is to be taken, the 4-s, low-power current measurement is stopped to enable the full measurement set to begin. To optimize the accumulated charge integration, the value of Power:Sleep:Voltage Time can be set to 5 s or (4 × n + 1) seconds, which minimizes the time while the 4-s, low-power current measurement is stopped. All temperature protections use the ADC measurements taken at the Power:Sleep:Voltage Time intervals, so they update at a reduced rate during SLEEP mode.

The BQ76952 device will exit SLEEP mode if a protection fault occurs, or current begins flowing, or a charger is attached, or the 0x009A SLEEP_DISABLE() subcommand is sent, or if the RST_SHUT pin is asserted for < 1 s. When exiting based on current flow, the device will quickly enable the FETs (if the CHG FET was off, or the DSG FET was in source follower mode), but the standard measurement loop is not restarted until the next 1-s boundary occurs within the device timing. Therefore, new data may not be available for up to ≈1-s after the device exits SLEEP mode.

The coulomb counter ADC operates in a reduced power and speed mode to monitor current during SLEEP mode. The current is measured at periodic intervals and, if it exceeds Power:Sleep:Wake Comparator Current in magnitude, the device quickly transitions back to NORMAL mode. In addition to this check, if the 4-s current measurement taken at each Power:Sleep:Voltage Time interval exceeds Power:Sleep:Sleep Current, the device will exit SLEEP mode.

The rate at which the coulomb counter ADC operates in this wake comparator mode is programmable using the Settings:Configuration:Power Config[WK_SPD_1:0] configuration bits. These bits were originally designated reserved, with the bits denoted RSVD_1 and RSVD_0 in BQSTUDIO. By changing the conversion rate, the noise level of the resulting ADC conversions is also modified, with higher noise levels at faster conversion rates. The tables below summarize the bit name changes and settings.

Table 7-1 Settings:Configuration:Power Config[WK_SPD_1:0] Bit Names
Bit Previous Bit Name New Bit Name
1 RSVD_1 WK_SPD_1
0 RSVD_0 WK_SPD_0
Table 7-2 Wake Comparator Speed Settings
WK_SPD_1 WK_SPD_0 Current Measurement Speed Measurement Noise Level (One Sigma)1 Comment
0 0 48 ms ~6 μV Recommended option for best accuracy
0 1 24 ms ~10 μV
1 0 12 ms ~25 μV Not recommended
1 1 6 ms ~100 μV Recommend only when used with thresholds > 1000 μV
The coulomb counter digitizes the differential voltage between the SRP and SRN pins on the device. This measurement is converted to a current value for comparison with the Wake Comparator Current threshold value. The measurement noise of the ADC is described here as the equivalent voltage measured between the SRP and SRN pins. The approximate noise current can be calculated by dividing this noise voltage level by the value of the sense resistor used in the system.

The setting WK_SPD[1:0] = 0x0 provides the lowest noise level, with measurements exhibiting a sigma of approximately 6 μV, and a measurement taken every 48 ms. If a faster measurement rate is desired, then the setting 0x1 results in a sigma of approximately 10 μV and a measurement taken every 24 ms. If an even faster measurement rate is needed, the setting 0x3 can be used to provide a measurement every 6 ms. However, the sigma of this measurement is approximately 100 μV, which can result in unintentional wakeup from SLEEP mode if the threshold is set too low. For this reason, this setting is recommended only for use if the Power:Sleep:Wake Comparator Current is set so that the differential voltage |VSRP – VSRN| > 1000 μV. Note that a six-sigma excursion using the 0x3 setting can cause a wakeup with a current approximately 600μV below the programmed threshold. The setting 0x2 (which is the default setting) may exhibit a large offset level and should not be used.

The device also monitors the PACK pin voltage and the top-of-stack voltage at each Power:Sleep:Voltage Time measurement interval. If the PACK pin voltage is higher than the top-of-stack voltage by more than Power:Sleep:Sleep Charger PACK-TOS Delta and the top-of-stack voltage is less than Power:Sleep:Sleep Charger Voltage Threshold, the device will exit SLEEP mode. The BQ76952 device also includes a hysteresis on the SLEEP mode entrance, in order to avoid the device quickly entering and exiting SLEEP mode based on a dynamic load. After transitioning to NORMAL mode, the device will not enter SLEEP mode again for a number of seconds given by the Power:Sleep:Sleep Hysteresis Time setting.

During SLEEP mode, the DSG FET can be driven either using the charge pump or in source-follower mode, as described in High-Side NFET Drivers. The CHG FET can be disabled or driven using the charge pump, based on the setting of Settings:FET:FET Options[SLEEPCHG].