SLVK305 October   2026 LMX2624-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Device and Test Board Information
  6. 3 Irradiation Facility and Setup
  7. 4 LETEFF and Range Calculation
  8. 5 Test Setup and Procedures
  9. 6 Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7 Single-Event Transients (SET)
    1. 7.1 Single Event Transients (SET)
    2. 7.2 Single Event Transients (SET) - Device Configuration 3
    3. 7.3 Single Event Transients (SET) - Device Configuration 4
  11. 8 Single Event Upsets Signature
  12. 9 Single Event Functional Interrupt (SEFI)
  13.   Summary
  14. 10References

9 Single Event Functional Interrupt (SEFI)

During Single Event Latch Up (SEL) and Single Event Transient (SEL) testing and characterization, LMX2624-SP device was continuously monitored for Single Event Functional Interrupt (SEFI). While LMX2624-SP device was testing under radiation, there was no evidence that a SEFI occurred. It can be concluded that LMX2624-SP is SEFI free up to 83 MeV×cm2 /mg.