SLVSDR2C November   2018  – March 2025 ADC12DJ3200QML-SP

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics: DC Specifications
    6. 5.6  Electrical Characteristics: Power Consumption
    7. 5.7  Electrical Characteristics: AC Specifications (Dual-Channel Mode)
    8. 5.8  Electrical Characteristics: AC Specifications (Single-Channel Mode)
    9. 5.9  Timing Requirements
    10. 5.10 Switching Characteristics
    11. 5.11 Timing Diagrams
    12. 5.12 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Analog Inputs
        1. 6.3.1.1 Analog Input Protection
        2. 6.3.1.2 Full-Scale Voltage (VFS) Adjustment
        3. 6.3.1.3 Analog Input Offset Adjust
      2. 6.3.2 ADC Core
        1. 6.3.2.1 ADC Theory of Operation
        2. 6.3.2.2 ADC Core Calibration
        3. 6.3.2.3 ADC Overrange Detection
        4. 6.3.2.4 Code Error Rate (CER)
      3. 6.3.3 Timestamp
      4. 6.3.4 Clocking
        1. 6.3.4.1 Noiseless Aperture Delay Adjustment (tAD Adjust)
        2. 6.3.4.2 Aperture Delay Ramp Control (TAD_RAMP)
        3. 6.3.4.3 SYSREF Capture for Multi-Device Synchronization and Deterministic Latency
          1. 6.3.4.3.1 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
          2. 6.3.4.3.2 Automatic SYSREF Calibration
      5. 6.3.5 Digital Down Converters (Dual-Channel Mode Only)
        1. 6.3.5.1 Numerically-Controlled Oscillator and Complex Mixer
          1. 6.3.5.1.1 NCO Fast Frequency Hopping (FFH)
          2. 6.3.5.1.2 NCO Selection
          3. 6.3.5.1.3 Basic NCO Frequency Setting Mode
          4. 6.3.5.1.4 Rational NCO Frequency Setting Mode
          5. 6.3.5.1.5 NCO Phase Offset Setting
          6. 6.3.5.1.6 NCO Phase Synchronization
        2. 6.3.5.2 Decimation Filters
        3. 6.3.5.3 Output Data Format
        4. 6.3.5.4 Decimation Settings
          1. 6.3.5.4.1 Decimation Factor
          2. 6.3.5.4.2 DDC Gain Boost
      6. 6.3.6 JESD204B Interface
        1. 6.3.6.1 Transport Layer
        2. 6.3.6.2 Scrambler
        3. 6.3.6.3 Link Layer
          1. 6.3.6.3.1 Code Group Synchronization (CGS)
          2. 6.3.6.3.2 Initial Lane Alignment Sequence (ILAS)
          3. 6.3.6.3.3 8b, 10b Encoding
          4. 6.3.6.3.4 Frame and Multiframe Monitoring
        4. 6.3.6.4 Physical Layer
          1. 6.3.6.4.1 SerDes Pre-Emphasis
        5. 6.3.6.5 JESD204B Enable
        6. 6.3.6.6 Multi-Device Synchronization and Deterministic Latency
        7. 6.3.6.7 Operation in Subclass 0 Systems
      7. 6.3.7 Alarm Monitoring
        1. 6.3.7.1 NCO Upset Detection
        2. 6.3.7.2 Clock Upset Detection
      8. 6.3.8 Temperature Monitoring Diode
      9. 6.3.9 Analog Reference Voltage
    4. 6.4 Device Functional Modes
      1. 6.4.1 Dual-Channel Mode
      2. 6.4.2 Single-Channel Mode (DES Mode)
      3. 6.4.3 JESD204B Modes
        1. 6.4.3.1 JESD204B Output Data Formats
        2. 6.4.3.2 Dual DDC and Redundant Data Mode
      4. 6.4.4 Power-Down Modes
      5. 6.4.5 Test Modes
        1. 6.4.5.1 Serializer Test-Mode Details
        2. 6.4.5.2 PRBS Test Modes
        3. 6.4.5.3 Ramp Test Mode
        4. 6.4.5.4 Short and Long Transport Test Mode
          1. 6.4.5.4.1 Short Transport Test Pattern
          2. 6.4.5.4.2 Long Transport Test Pattern
        5. 6.4.5.5 D21.5 Test Mode
        6. 6.4.5.6 K28.5 Test Mode
        7. 6.4.5.7 Repeated ILA Test Mode
        8. 6.4.5.8 Modified RPAT Test Mode
      6. 6.4.6 Calibration Modes and Trimming
        1. 6.4.6.1 Foreground Calibration Mode
        2. 6.4.6.2 Background Calibration Mode
        3. 6.4.6.3 Low-Power Background Calibration (LPBG) Mode
      7. 6.4.7 Offset Calibration
      8. 6.4.8 Trimming
      9. 6.4.9 Offset Filtering
    5. 6.5 Programming
      1. 6.5.1 Using the Serial Interface
        1. 6.5.1.1 SCS
        2. 6.5.1.2 SCLK
        3. 6.5.1.3 SDI
        4. 6.5.1.4 SDO
        5. 6.5.1.5 Streaming Mode
    6. 6.6 Register Maps
      1. 6.6.1 Register Descriptions
      2. 6.6.2 SYSREF Calibration Registers (0x2B0 to 0x2BF)
      3. 6.6.3 Alarm Registers (0x2C0 to 0x2C2)
  8. 7 Application Information Disclaimer
    1. 7.1 Application Information
      1. 7.1.1 Analog Inputs
      2. 7.1.2 Analog Input Bandwidth
      3. 7.1.3 Clocking
      4. 7.1.4 Radiation Environment Recommendations
        1. 7.1.4.1 Single Event Latch-Up (SEL)
        2. 7.1.4.2 Single Event Functional Interrupt (SEFI)
        3. 7.1.4.3 Single Event Upset (SEU)
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
        1. 7.2.2.1 RF Input Signal Path
        2. 7.2.2.2 Calculating Values of AC-Coupling Capacitors
      3. 7.2.3 Application Curves
    3. 7.3 Initialization Set Up
    4.     Power Supply Recommendations
      1. 7.4.1 Power Sequencing
    5. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Third-Party Products Disclaimer
    4. 8.4 Receiving Notification of Documentation Updates
    5. 8.5 Support Resources
    6. 8.6 Trademarks
    7. 8.7 Electrostatic Discharge Caution
    8. 8.8 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

5.11 Timing Diagrams

Table 5-1 Quality Conformance Inspection(1)
SUBGROUP DESCRIPTION TEMPERATURE (°C)
1 Static tests at 25
2 Static tests at 125
3 Static tests at –55
4 Dynamic tests at 25
5 Dynamic tests at 125
6 Dynamic tests at –55
7 Functional tests at 25
8A Functional tests at 125
8B Functional tests at –55
9 Switching tests at 25
10 Switching tests at 125
11 Switching tests at –55
(1) MIL-STD-883, Method 5005 - Group A
ADC12DJ3200QML-SP ADC Timing Diagram
A. Only the SerDes lane DA0± is shown, but DA0± is representative of all lanes. The number of output lanes used and bit-packing format is dependent on the programmed JMODE value.
Figure 5-1 ADC Timing Diagram
ADC12DJ3200QML-SP SYNCSE and TMSTP± Timing Diagram for NCO Synchronization
A. It is assumed that the internal LMFC is aligned with the rising edge of CLK± that captures the SYSREF± high value.
B. Only SerDes lane DA0± is shown, but DA0± is representative of all lanes. All lanes output /R at approximately the same point in time. The number of lanes is dependent on the programmed JMODE value.
Figure 5-2 SYNCSE and TMSTP± Timing Diagram for NCO Synchronization
ADC12DJ3200QML-SP Serial Interface Timing Figure 5-3 Serial Interface Timing