SLVSDR2C November 2018 – March 2025 ADC12DJ3200QML-SP
PRODUCTION DATA
Figure 7-8 to Figure 7-10 provide examples of the critical traces routed on the device evaluation module (EVM).
Figure 7-8 Top Layer Routing: Analog Inputs, CLK and SYSREF, DA0-3, DB0-3
Figure 7-9 GND1 Cutouts to Optimize Impedance of Component Pads
Figure 7-10 Bottom Layer Routing: Additional CLK Routing, DA4-7, DB4-7