ADC12DJ3200QML-SP

ACTIVE

Radiation-hardened, QML-V, 300krad, 12 bit, dual 3.2GSPS or single 6.4GSPS ADC

ADC12DJ3200QML-SP

ACTIVE

Product details

Sample rate (max) (Msps) 3200, 6400 Resolution (Bits) 12 Number of input channels 1, 2 Interface type JESD204B Analog input BW (MHz) 7300 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 3000 Architecture Folding Interpolating SNR (dB) 57.2 ENOB (Bits) 8.9 SFDR (dB) 76 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 300 Radiation, SEL (MeV·cm2/mg) 120
Sample rate (max) (Msps) 3200, 6400 Resolution (Bits) 12 Number of input channels 1, 2 Interface type JESD204B Analog input BW (MHz) 7300 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 3000 Architecture Folding Interpolating SNR (dB) 57.2 ENOB (Bits) 8.9 SFDR (dB) 76 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 300 Radiation, SEL (MeV·cm2/mg) 120
CCGA-FC (NWE) 196 225 mm² (15 mm × 15 mm)
  • ADC core:
    • 12-Bit resolution
    • Up to 6.4GSPS in single-channel mode
    • Up to 3.2GSPS in dual-channel mode
  • Noise floor (no signal, VFS = 1VPP-DIFF):
    • Dual-channel mode: –149.5dBFS/Hz
    • Single-channel mode: –152.4dBFS/Hz
  • Peak noise power ratio (NPR): 45.4dB
  • Buffered analog inputs with VCMI of 0V:
    • Analog input bandwidth (–3dB): 7GHz
    • Usable input frequency range: >10GHz
    • Full-scale input voltage (VFS, default): 0.8VPP
  • Noiseless aperture delay (tAD) adjustment:
    • Precise sampling control: 19fs step size
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features
    • Automatic SYSREF timing calibration
    • Timestamp for sample marking
  • JESD204B subclass-1 compliant interface:
    • Maximum lane rate: 12.8Gbps
    • Up to 16 lanes allows reduced lane rate
  • Digital down-converters in dual-channel mode:
    • Real output: DDC bypass or 2x decimation
    • Complex output: 4x, 8x, or 16x decimation
  • Radiation performance:
    • Total Ionizing Dose (TID): 300krad (Si)
    • Single Event Latchup (SEL): 120MeV-cm2/mg
    • Single Event Upset (SEU) immune registers
  • Power consumption: 3W
  • ADC core:
    • 12-Bit resolution
    • Up to 6.4GSPS in single-channel mode
    • Up to 3.2GSPS in dual-channel mode
  • Noise floor (no signal, VFS = 1VPP-DIFF):
    • Dual-channel mode: –149.5dBFS/Hz
    • Single-channel mode: –152.4dBFS/Hz
  • Peak noise power ratio (NPR): 45.4dB
  • Buffered analog inputs with VCMI of 0V:
    • Analog input bandwidth (–3dB): 7GHz
    • Usable input frequency range: >10GHz
    • Full-scale input voltage (VFS, default): 0.8VPP
  • Noiseless aperture delay (tAD) adjustment:
    • Precise sampling control: 19fs step size
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features
    • Automatic SYSREF timing calibration
    • Timestamp for sample marking
  • JESD204B subclass-1 compliant interface:
    • Maximum lane rate: 12.8Gbps
    • Up to 16 lanes allows reduced lane rate
  • Digital down-converters in dual-channel mode:
    • Real output: DDC bypass or 2x decimation
    • Complex output: 4x, 8x, or 16x decimation
  • Radiation performance:
    • Total Ionizing Dose (TID): 300krad (Si)
    • Single Event Latchup (SEL): 120MeV-cm2/mg
    • Single Event Upset (SEU) immune registers
  • Power consumption: 3W

The ADC12DJ3200QML-SP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from dc to above 10GHz. In dual-channel mode, the ADC12DJ3200QML-SP can sample up to 3200MSPS. In single-channel mode, the device can sample up to 6400MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3dB) of 7GHz, with usable frequencies exceeding the –3dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ3200QML-SP uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multidevice synchronization. The serial output lanes support up to 12.8Gbps, and can be configured to trade off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (tAD) adjustment and SYSREF windowing, simplify system design for synthetic aperture radar (SAR) and phased-array MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

The ADC12DJ3200QML-SP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from dc to above 10GHz. In dual-channel mode, the ADC12DJ3200QML-SP can sample up to 3200MSPS. In single-channel mode, the device can sample up to 6400MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3dB) of 7GHz, with usable frequencies exceeding the –3dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ3200QML-SP uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multidevice synchronization. The serial output lanes support up to 12.8Gbps, and can be configured to trade off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (tAD) adjustment and SYSREF windowing, simplify system design for synthetic aperture radar (SAR) and phased-array MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

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Evaluation board

ADC12DJ3200EVMCVAL — ADC12DJ3200QML-SP evaluation module

The ADC12DJ3200 evaluation module (EVM) is designed to evaluate the ADC12DJ3200QML-SP high-speed analog-to-digital converters (ADCs). The EVM is populated with the ADC12DJ3200QML-SP, a space-grade 12-bit, dual-channel 4GSPS or single-channel 8GSPS ADC with JESD204B interface.
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TI204C-IP — Request for JESD204 rapid design IP

The JESD204 rapid design IP has been designed to enable FPGA engineers to achieve an accelerated path to a working JESD204 system. The IP has been architected in a way that downstream digital processing and other application logic are isolated from most of the performance- and timing-critical (...)

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ADC12DJ3200 and ADC12DJ3200QML-SP IBIS and IBIS-AMI Model

SLVMDV3.ZIP (47828 KB) - IBIS-AMI model
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ADC12DJ3200QML-SP S-Parameter Model

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