SNVA967C June   2020  – April 2021 LM34966-Q1 , LM5156 , LM5156-Q1 , LM51561 , LM51561-Q1 , LM51561H , LM51561H-Q1 , LM5156H , LM5156H-Q1


  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
  3. 3Functional Safety Failure In Time (FIT) Rates
  4. 4Failure Mode Distribution (FMD)
  5. 5Pin Failure Mode Analysis (Pin FMA)
  6. 6Pin Failure Mode Analysis (Pin FMA) – HTSSOP
  7. 7Revision History

Failure Mode Distribution (FMD)

The failure mode distribution estimation for LM5156, LM5156-Q1, LM51561, LM51561-Q1, LM5156H, LM5156H-Q1, LM51561H, LM51561H-Q1, and LM34966-Q1 (WSON and HTSSOP packages) in Table 4-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.

Table 4-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
No Output Voltage60%
Output not in specification – voltage or timing30%
Gate Driver stuck on5%
Power Good – False Trip or Failure to Trip5%