It is recommended to perform thermal simulations at the system level
with the worst case device power consumption.
| NO. |
PARAMETER |
DESCRIPTION |
ALW PACKAGE °C/W(1)(2) |
ALW AEC - Q100 QUALIFIED PACKAGE °C/W(1)(2) |
AMC AEC - Q100 QUALIFIED PACKAGE °C/W(1)(2) |
AIR FLOW (m/s)(3) |
| T1 |
RΘJC |
Junction-to-case |
4.3 |
3.2 |
1.2 |
N/A |
| T2 |
RΘJB |
Junction-to-board |
7.1 |
6.0 |
3.9 |
N/A |
| T3 |
RΘJA |
Junction-to-free
air |
19.3 |
18.3 |
13.3 |
0 |
| T4 |
Junction-to-moving air |
14.5 |
13.4 |
9.7 |
1 |
| T5 |
13.4 |
12.3 |
8.7 |
2 |
| T6 |
12.8 |
11.7 |
8.1 |
3 |
| T7 |
ΨJT |
Junction-to-package top |
0.11 |
0.07 |
0.73 |
0 |
| T8 |
0.21 |
0.14 |
0.75 |
1 |
| T9 |
0.26 |
0.18 |
0.76 |
2 |
| T10 |
0.31 |
0.22 |
0.77 |
3 |
| T11 |
ΨJB |
Junction-to-board |
7.0 |
5.9 |
3.7 |
0 |
| T12 |
6.6 |
5.5 |
3.4 |
1 |
| T13 |
6.5 |
5.4 |
3.3 |
2 |
| T14 |
6.5 |
5.4 |
3.3 |
3 |
(1) °C/W = degrees Celsius per watt.
(2) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/JEDEC standards:
- JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
- JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
- JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
- JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
- JESD51-9, Test Boards for Area Array Surface Mount Packages
(3) m/s = meters per second.