SPRZ171T December   2004  – September 2020 SM320F2801-EP , SM320F2808-EP , TMS320F2801 , TMS320F2801-Q1 , TMS320F28015 , TMS320F28016 , TMS320F28016-Q1 , TMS320F2802 , TMS320F2802-Q1 , TMS320F2806 , TMS320F2806-Q1 , TMS320F2808 , TMS320F2808-Q1 , TMS320F2809 , TMS320F2809-Q1

 

  1. 1Introduction
  2. 2Device and Development Tool Support Nomenclature
  3. 3Device Markings
  4. 4Silicon Change Overview
  5. 5Usage Notes and Known Design Exceptions to Functional Specifications
    1. 5.1 Usage Notes
      1. 5.1.1 PIE: Spurious Nested Interrupt After Back-to-Back PIEACK Write and Manual CPU Interrupt Mask Clear Usage Note
    2. 5.2 Known Design Exceptions to Functional Specifications
      1.      Advisory
      2.      Advisory
      3.      Advisory
      4.      Advisory
      5.      Advisory
      6.      Advisory
      7.      Advisory
      8.      Advisory
      9.      Advisory
      10.      Advisory
      11.      Advisory
      12.      Advisory
      13.      Advisory
      14.      Advisory
      15.      Advisory
      16.      Advisory
      17.      Advisory
      18.      Advisory
      19.      Advisory
      20.      Advisory
      21.      Advisory
      22.      Advisory
  6. 6Documentation Support
  7. 7Trademarks
  8. 8Revision History

Advisory

ADC: Simultaneous Sampling Latency

Revision(s) Affected

0, A on F2809 silicon

0, A on C280x silicon

0, A, B, C on F2801, F2802, F2806, F2808, and F2801x silicon

Details

When the ADC conversions are initiated in simultaneous mode, the first sample pair will not give correct conversion results.

Workaround(s)

1. If the ADC is used with a sampling window ≤ 160 nS, then the first sample pair must be discarded and a second sample of the same pair must be taken. For instance, if the sequencer is set to sample channel A0:B0/A1:B1/A2:B2 in that order, then load the sequencer with A0:B0/A0:B0/A1:B1/A2:B2 and only use the last three conversions.

2. If the ADC is used with a sampling window greater than 160 ns, there is no issue.