TIDUFK2 September   2026

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1System Description
    1. 1.1 Terminology
    2. 1.2 Key System Specifications
  8. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
      1. 2.2.1 Processing
      2. 2.2.2 Voltage and Current Sensing
        1. 2.2.2.1 Voltage Measurement
        2. 2.2.2.2 Current Measurement
      3. 2.2.3 Solenoid – Relay Driver
      4. 2.2.4 Temperature Measurement
    3. 2.3 Highlighted Products
      1. 2.3.1 CC2340R53
      2. 2.3.2 OPA2323
      3. 2.3.3 DRV8213
      4. 2.3.4 TMP236A2
  9. 3System Design Theory
    1. 3.1 Software Architecture
      1. 3.1.1 System Initialization
      2. 3.1.2 Sample Acquisition
      3. 3.1.3 Sample Processing and Task Prioritization
    2. 3.2 Circuit Breaker Functionality
      1. 3.2.1 Breaker State and Relay Control
      2. 3.2.2 Instantaneous Short-Circuit Trip
      3. 3.2.3 Inverse-Time Overload Trip
    3. 3.3 Electrical Metrology
    4. 3.4 Zigbee Connectivity
  10. 4Hardware, Software, Testing Requirements, and Test Results
    1. 4.1 Hardware Requirements
      1. 4.1.1 Hardware Connections and Test Points
    2. 4.2 Test Setup
      1. 4.2.1 Connecting the TIDA-011030 to the Metering Test Equipment
      2. 4.2.2 Power-Supply Options
      3. 4.2.3 Metrology Calibration
      4. 4.2.4 Test-Data Acquisition and Error Calculation
    3. 4.3 Test Results
      1. 4.3.1 Relay Control and Protection
        1. 4.3.1.1 Relay Pull-In and Holding PWM
        2. 4.3.1.2 Instantaneous Trip and Relay-Opening Latency
        3. 4.3.1.3 Inverse-Time Overload Trip
      2. 4.3.2 Metering
      3. 4.3.3 Real-Time Software Performance
      4. 4.3.4 Zigbee Functional Test
  11. 5Design and Documentation Support
    1. 5.1 Tools and Software
      1. 5.1.1 Tools
      2. 5.1.2 Software
    2. 5.2 Documentation Support
    3.     Trademarks
  12. 6About the Author

Instantaneous Trip and Relay-Opening Latency

The instantaneous-trip function was tested using a 50Hz current waveform with a peak current exceeding the configured trip threshold. The following oscilloscope signals were recorded:

  • ADC-I: amplified current-sensing signal at the MCU ADC input
  • Shunt-P: voltage measured single-ended at the positive terminal of the shunt, referenced to the local circuit ground
  • DRV-IN1: relay-driver enable signal

The current source was operated close to the maximum output capability and produced a visibly distorted waveform. In particular, the current waveform became clipped at high amplitudes. The voltage measured directly at the shunt exhibits the same waveform shape as the amplified ADC signal. This confirms that the observed distortion originated from the test source rather than from the current-sensing analog front end.

TIDA-011030 Current Waveform and Upper and Lower Software Instantaneous-Current ThresholdsFigure 4-3 Current Waveform and Upper and Lower Software Instantaneous-Current Thresholds

The configured software instantaneous-current thresholds are 3.165V and 0.135V. With an ADC midpoint of 1.65V, a 1mΩ shunt, and an amplifier gain of 20.6, these values correspond to a peak-current threshold of:

Equation 59. ITH,PK=3.165 V-1.65 V1 mΩ×20.6=73.54 A

For a sinusoidal current, the corresponding RMS threshold is:

Equation 60. ITH,RMS=73.54 A2=52.0 A=3.25×In
TIDA-011030 Short Positive Threshold Violation Rejected by the Three-Sample Debounce QualificationFigure 4-4 Short Positive Threshold Violation Rejected by the Three-Sample Debounce Qualification

During the positive half-cycle of the second mains period, a short current peak exceeded the upper threshold for approximately 228.4µs. Since the ADC samples the current every 125µs and the instantaneous protection requires three consecutive threshold violations, this transient did not satisfy the trip criterion and was rejected.

TIDA-011030 Time From the Sustained Lower-Threshold Crossing to Disabling DRV_IN1_ENFigure 4-5 Time From the Sustained Lower-Threshold Crossing to Disabling DRV_IN1_EN

During the subsequent negative half-cycle, the current remained outside the configured window for sufficiently long to satisfy the three-sample qualification. The measured interval from the selected lower-threshold crossing to disabling of DRV_IN1_EN was 768.6µs. This represents the observed electronic response and includes ADC sample alignment, threshold qualification, firmware processing, and GPIO actuation.

TIDA-011030 Total Time from Threshold Crossing to Complete Interruption of the Load CurrentFigure 4-6 Total Time from Threshold Crossing to Complete Interruption of the Load Current

After DRV_IN1_EN was disabled, the current continued briefly while the relay contacts moved. The measured interval from the threshold crossing to complete current interruption was 2.7412ms. The resulting approximate mechanical relay-opening interval after the driver command was therefore:

Equation 61. tRELAY=2.7412 ms-0.7686 ms=1.9726 ms

The complete measured response from the selected threshold crossing to current interruption was approximately 2.74ms. During this test, the sustained negative current exceeded the software instantaneous-current threshold but remained within the hardware comparator window. The trip was therefore initiated by the sample-based software protection rather than the ADC-saturation path. The measured response is well below the 100ms maximum operating-time target used for instantaneous protection.