Inicio Convertidores de datos Convertidores digital-analógicos (DAC) DAC de alta velocidad (> 10 MSPS)
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Convertidores de datos
Convertidores digital-analógicos (DAC)
DAC de alta velocidad (> 10 MSPS)
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DAC39RF10-SP

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Convertidor digital a analógico de RF de 12 GHz, 10.4 GSPS, 2 canal, 16 bits y 300 krad con dureza d

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DAC39RF10-SP

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Detalles del producto

Resolution (Bits) 16 Number of DAC channels 2 Interface type JESD204B, JESD204C Sample/update rate (Msps) 10400, 20800 Features Bypass Mode, Differential Outputs, Direct Digital Synthesis (DDS) - NCO, High Dynamic Range, High Performance, Internal Reference, Multi-device sync, Space Qualified, Ultra High Speed Rating Catalog Interpolation 128x, 12x, 16x, 192x, 1x, 24x, 256x, 2x, 32x, 3x, 48x, 4x, 64x, 6x, 8x, 96x Power consumption (typ) (mW) 3800 SFDR (dB) 85 Architecture Current Source Operating temperature range (°C) -55 to 125 Reference type Ext, Int
Resolution (Bits) 16 Number of DAC channels 2 Interface type JESD204B, JESD204C Sample/update rate (Msps) 10400, 20800 Features Bypass Mode, Differential Outputs, Direct Digital Synthesis (DDS) - NCO, High Dynamic Range, High Performance, Internal Reference, Multi-device sync, Space Qualified, Ultra High Speed Rating Catalog Interpolation 128x, 12x, 16x, 192x, 1x, 24x, 256x, 2x, 32x, 3x, 48x, 4x, 64x, 6x, 8x, 96x Power consumption (typ) (mW) 3800 SFDR (dB) 85 Architecture Current Source Operating temperature range (°C) -55 to 125 Reference type Ext, Int
FCBGA (ACL) 256 289 mm² (17 mm × 17 mm)
  • Radiation hardness assured DAC39RFx10-SP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 120MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 300krad (Si)
  • Radiation tolerant DAC39RFx10-SEP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 43MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 30krad (Si)
  • 16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC Cores
  • Maximum input data rate:
    • 8-bit, Single channel, DES mode: 20.8GSPS
    • 12-bit, Single channel, DES mode: 15.5GSPS
    • 16-bit, Single channel: 10.4GSPS
    • 8-bit, Dual channel, 10.4GSPS
    • 12-bit, Dual channel: 7.75GSPS/ch
    • 16-bit, Dual channel: 6.2GSPS/ch
  • Output bandwidth (-3dB): 12GHz
  • Performance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither off
    • Noise floor (small signal): –155dBFS/Hz
    • SFDR (-0.1dBFS) : 60dBc
    • IMD3 (-7dBFS each tone) : –62dBc
    • Additive phase noise, 10kHz offset: -138dBc/Hz
  • Four Integrated digital up-converters (DUC)
    • Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256x
    • Complex baseband DUC for I/Q output
    • Complex to real up conversion for dual channel direct RF sampling
    • 64-bit frequency resolution NCOs
  • JESD204C Interface
    • Up to 16 Lanes at up to 12.8Gbps
    • Class C-S, subclass-1 Compatible
    • Internal AC coupling capacitors
  • SYSREF Windowing for automatic SYSREF timing calibration
  • Space screening and assurance:
    • Meets ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Wafer lot traceability
    • Extended product life cycle
    • Radiation lot acceptance test (RLAT)
    • Production burn-in (DAC39RFx10-SP only)
  • This device contains non-encapsulated chip-caps with tin (Sn) finish of >97% purity. See reliability report for more information
  • Radiation hardness assured DAC39RFx10-SP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 120MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 300krad (Si)
  • Radiation tolerant DAC39RFx10-SEP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 43MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 30krad (Si)
  • 16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC Cores
  • Maximum input data rate:
    • 8-bit, Single channel, DES mode: 20.8GSPS
    • 12-bit, Single channel, DES mode: 15.5GSPS
    • 16-bit, Single channel: 10.4GSPS
    • 8-bit, Dual channel, 10.4GSPS
    • 12-bit, Dual channel: 7.75GSPS/ch
    • 16-bit, Dual channel: 6.2GSPS/ch
  • Output bandwidth (-3dB): 12GHz
  • Performance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither off
    • Noise floor (small signal): –155dBFS/Hz
    • SFDR (-0.1dBFS) : 60dBc
    • IMD3 (-7dBFS each tone) : –62dBc
    • Additive phase noise, 10kHz offset: -138dBc/Hz
  • Four Integrated digital up-converters (DUC)
    • Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256x
    • Complex baseband DUC for I/Q output
    • Complex to real up conversion for dual channel direct RF sampling
    • 64-bit frequency resolution NCOs
  • JESD204C Interface
    • Up to 16 Lanes at up to 12.8Gbps
    • Class C-S, subclass-1 Compatible
    • Internal AC coupling capacitors
  • SYSREF Windowing for automatic SYSREF timing calibration
  • Space screening and assurance:
    • Meets ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Wafer lot traceability
    • Extended product life cycle
    • Radiation lot acceptance test (RLAT)
    • Production burn-in (DAC39RFx10-SP only)
  • This device contains non-encapsulated chip-caps with tin (Sn) finish of >97% purity. See reliability report for more information

The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band.

The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS).

A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.

The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band.

The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS).

A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.
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Documentación técnica

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Documentación principal Tipo Título Opciones de formato Descargar la versión más reciente en inglés Fecha
* Hoja de datos DAC39RFx10-SP DAC39RFx10-SEP 10.4 or 20.8GSPS, 16-bit, Dual and Single Channel, Multi-Nyquist Digital-to-Analog Converter (DAC) with JESD204C Interface datasheet (Rev. A) PDF | HTML 24/02/2026
* Informe de radiación y confiabilidad DAC39RF10-SP Single Event Effects Report PDF | HTML 16/04/2026
* Informe de radiación y confiabilidad DAC39RF10-SP Production Flow and Reliability Report (Rev. A) PDF | HTML 27/03/2026
* Informe de radiación y confiabilidad DAC39RFx10-SP Total Ionizing Dose (TID) Radiation Report PDF | HTML 20/01/2026

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

DAC39RF12EVM — Módulo de evaluación DAC39RF12

La DAC39RF12EVM es una placa de evaluación de la familia de convertidores digital a analógico (DAC) DAC39RF10 y DAC39RF12. El DAC39RF10 y el DAC39RF12 es una familia de DAC de uno y dos canales con una resolución de 16 bits. Los dispositivos pueden utilizarse en modos de no interpolación (real), (...)
Guía del usuario: PDF | HTML
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En inventario
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GUI para el módulo de evaluación (EVM)

DAC39RF12EVM-GUI — DAC39RF12EVM-GUI

DAC39RF12EVM Control GUI
Productos y hardware compatibles
Productos y hardware compatibles
Modelo de simulación

DAC39RF10/12 Output S-Parameters

SBAM521.ZIP (79935 KB) - Modelo de parámetros-S
Productos y hardware compatibles
Herramienta de simulación

DAC39RF10/12 Simulink DUC Model

SBAM519.ZIP (569 KB) - Herramienta de simulación
Productos y hardware compatibles
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
FCBGA (ACL) 256 Ultra Librarian
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Pedidos y calidad

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Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

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