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SN74HC244-EP

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エンハンスド製品、3 ステート出力、8 チャネル、2V ～ 6V バッファ

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データシート

SN74HC244-EP

アクティブ
データシート ご注文はこちら

製品詳細

Technology family HC Number of channels 8 IOL (max) (mA) 7.8 Supply current (max) (µA) 80 IOH (max) (mA) -7.8 Input type Standard CMOS Output type 3-State Features Balanced outputs, Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family HC Number of channels 8 IOL (max) (mA) 7.8 Supply current (max) (µA) 80 IOH (max) (mA) -7.8 Input type Standard CMOS Output type 3-State Features Balanced outputs, Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
TSSOP (PW) 20 41.6 mm² (6.5 mm × 6.4 mm) SOIC (DW) 20 131.84 mm² (12.8 mm × 10.3 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55° to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers
  • High-Current Outputs Drive up to 15 LSTTL Loads

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55° to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers
  • High-Current Outputs Drive up to 15 LSTTL Loads

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

These octal buffers and line drivers are designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The ’HC244 are organized as two 4-bit buffers/drivers with separate output-enable (OE)\ inputs. When OE\ is low, the device passes noninverted data from the A inputs to the Y outputs. When OE\ is high, the outputs are in the high-impedance state.

These octal buffers and line drivers are designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The ’HC244 are organized as two 4-bit buffers/drivers with separate output-enable (OE)\ inputs. When OE\ is low, the device passes noninverted data from the A inputs to the Y outputs. When OE\ is high, the outputs are in the high-impedance state.
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上位の文書 タイプ タイトル フォーマットオプション 最新の英語版をダウンロード 日付
* データシート Octal Buffers and Line Drivers With 3-State Outputs データシート (Rev. A) 2004/01/06
* 放射線と信頼性レポート SN74HC244QDWREP Reliability Report 2012/03/15
* VID SN74HC244-EP VID V6203607 2016/06/21

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