제품 상세 정보

Number of channels 1 Output type Open-drain Propagation delay time (µs) 0.29 CMTI (min) (kV/µs) 55 Rating Catalog Operating temperature range (°C) -40 to 125 Isolation rating Reinforced Withstand isolation voltage (VISO) (Vrms) 5000 Transient isolation voltage (VIOTM) (VPK) 7070 Working isolation voltage (VIOWM) (Vrms) 750 Creepage (min) (mm) 8.5 Clearance (min) (mm) 8.5
Number of channels 1 Output type Open-drain Propagation delay time (µs) 0.29 CMTI (min) (kV/µs) 55 Rating Catalog Operating temperature range (°C) -40 to 125 Isolation rating Reinforced Withstand isolation voltage (VISO) (Vrms) 5000 Transient isolation voltage (VIOTM) (VPK) 7070 Working isolation voltage (VIOWM) (Vrms) 750 Creepage (min) (mm) 8.5 Clearance (min) (mm) 8.5
SOIC (DWV) 8 67.275 mm² 5.85 x 11.5
  • Wide high-side supply range: 3 V to 27 V
  • Low-side supply range: 2.7 V to 5.5 V
  • Adjustable threshold: 20 mV to 2.7 V
  • Reference current for threshold adjustment:
    • 100 µA, ±2%
  • Trip threshold error: ±1% (max) at 250 mV
  • Open-drain output with optional latch mode
  • Propagation delay: 240 ns (typ)
  • High CMTI: 55 V/ns (min)
  • Safety-related certifications:
    • 7000-VPK reinforced isolation per DIN EN IEC 60747-17 (VDE 0884-17)
    • 5000-VRMS isolation for 1 minute per UL1577
  • Fully specified over the extended industrial temperature range: –40°C to +125°C
  • Wide high-side supply range: 3 V to 27 V
  • Low-side supply range: 2.7 V to 5.5 V
  • Adjustable threshold: 20 mV to 2.7 V
  • Reference current for threshold adjustment:
    • 100 µA, ±2%
  • Trip threshold error: ±1% (max) at 250 mV
  • Open-drain output with optional latch mode
  • Propagation delay: 240 ns (typ)
  • High CMTI: 55 V/ns (min)
  • Safety-related certifications:
    • 7000-VPK reinforced isolation per DIN EN IEC 60747-17 (VDE 0884-17)
    • 5000-VRMS isolation for 1 minute per UL1577
  • Fully specified over the extended industrial temperature range: –40°C to +125°C

The AMC23C11 is an isolated comparator with a short response time. The open-drain output is separated from the input circuitry by an isolation barrier that is highly resistant to magnetic interference. This barrier is certified to provide reinforced galvanic isolation of up to 5 kVRMS according to VDE 0884-17 and UL1577, and supports a working voltage of up to 1 kVPK.

The trip threshold is adjustable from 20 mV to 450 mV in low-hysteresis mode and from 600 mV to 2.7 V in high-hysteresis mode through a single external resistor.

The open-drain output on the device supports transparent mode (LATCH input tied to GND2) where the output follows the input state, or latch mode, where the output is cleared on the falling edge of the latch input signal.

The AMC23C11 is available in an 8-pin, wide-body SOIC package and is specified over the extended industrial temperature range of –40°C to +125°C.

The AMC23C11 is an isolated comparator with a short response time. The open-drain output is separated from the input circuitry by an isolation barrier that is highly resistant to magnetic interference. This barrier is certified to provide reinforced galvanic isolation of up to 5 kVRMS according to VDE 0884-17 and UL1577, and supports a working voltage of up to 1 kVPK.

The trip threshold is adjustable from 20 mV to 450 mV in low-hysteresis mode and from 600 mV to 2.7 V in high-hysteresis mode through a single external resistor.

The open-drain output on the device supports transparent mode (LATCH input tied to GND2) where the output follows the input state, or latch mode, where the output is cleared on the falling edge of the latch input signal.

The AMC23C11 is available in an 8-pin, wide-body SOIC package and is specified over the extended industrial temperature range of –40°C to +125°C.

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기술 문서

설계 및 개발

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시뮬레이션 모델

AMC23C11 PSpice Model

SBAM501.ZIP (50 KB) - PSpice Model
시뮬레이션 모델

AMC23C11 TINA-TI Reference Design

SBAM477.TSC (4687 KB) - TINA-TI Reference Design
패키지 다운로드
SOIC (DWV) 8 옵션 보기

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

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