SCANSTA101

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Low voltage IEEE 1149.1 system test access (STA) master

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Data sheet

document-pdfAcrobat SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master datasheet (Rev. J)

SCANSTA101

ACTIVE

Data sheet

Order now

Product details

Protocols

Catalog

Rating

Catalog

Operating temperature range (°C)

-40 to 85

Protocols

Catalog

Rating

Catalog

Operating temperature range (°C)

-40 to 85

NFBGA (NZA)

49

49 mm² (7 mm × 7 mm)

Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0
Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of Processors and Processor Clock (PCLK) Frequencies
16-Bit Data Interface (IP Scalable to 32-bit)
2k x 32 Bit Dual-Port Memory
Load-on-the-Fly (LotF) and Preloaded Vector Operating Modes Supported
On-Board Sequencer Allows Multi-Vector Operations such as those Required to Load Data Into an FPGA
On-Board Compares Support Test Data In (TDI) Validation Against Preloaded Expected Data
32-Bit Linear Feedback Shift Register (LFSR) at the Test Data In (TDI) Port for Signature Compression
State, Shift, and BIST Macros Allow Predetermined Test Mode Select (TMS) Sequences to be Utilized
Operates at 3.3 V Supply Voltages with 5 V Tolerant I/O
Outputs Support Power-Down TRI-STATE Mode.

All trademarks are the property of their respective owners.

Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0
Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of Processors and Processor Clock (PCLK) Frequencies
16-Bit Data Interface (IP Scalable to 32-bit)
2k x 32 Bit Dual-Port Memory
Load-on-the-Fly (LotF) and Preloaded Vector Operating Modes Supported
On-Board Sequencer Allows Multi-Vector Operations such as those Required to Load Data Into an FPGA
On-Board Compares Support Test Data In (TDI) Validation Against Preloaded Expected Data
32-Bit Linear Feedback Shift Register (LFSR) at the Test Data In (TDI) Port for Signature Compression
State, Shift, and BIST Macros Allow Predetermined Test Mode Select (TMS) Sequences to be Utilized
Operates at 3.3 V Supply Voltages with 5 V Tolerant I/O
Outputs Support Power-Down TRI-STATE Mode.

All trademarks are the property of their respective owners.

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100. The SCANSTA101 supports the IEEE 1149.1 Test Access Port (TAP) standard and the IEEE 1532 standard for in-system configuration of programmable devices.

The SCANSTA101 improves test vector throughput and reduces software overhead in the system processor. The SCANSTA101 presents a simple, register-based interface to the system processor. Texas Instruments provides C-language source code which can be included in the embedded system software. The combination of the SCANSTA101 and its support software comprises a simple API for boundary scan operations.

The interface from the SCANSTA101 to the system processor is implemented by reading and writing registers, some of which map to locations in the SCANSTA101 memory. Hardware handshaking and interrupt lines are provided as part of the processor interface.

The SCANSTA101 is available as a stand-alone device packaged in a 49-pin NFBGA package. It is also available as an IP macro for synthesis in programmable logic devices.

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100. The SCANSTA101 supports the IEEE 1149.1 Test Access Port (TAP) standard and the IEEE 1532 standard for in-system configuration of programmable devices.

The SCANSTA101 improves test vector throughput and reduces software overhead in the system processor. The SCANSTA101 presents a simple, register-based interface to the system processor. Texas Instruments provides C-language source code which can be included in the embedded system software. The combination of the SCANSTA101 and its support software comprises a simple API for boundary scan operations.

The interface from the SCANSTA101 to the system processor is implemented by reading and writing registers, some of which map to locations in the SCANSTA101 memory. Hardware handshaking and interrupt lines are provided as part of the processor interface.

The SCANSTA101 is available as a stand-alone device packaged in a 49-pin NFBGA package. It is also available as an IP macro for synthesis in programmable logic devices.

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Top documentation	Type	Title	Date
*	Data sheet	SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master datasheet (Rev. J)	Apr 12, 2013
	Application note	SCANSTA101 Quick Reference Guide	Jan 7, 2010
	Application note	JTAG Advanced Capabilities and System Design	Mar 19, 2009

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Support software

EVF-WORKBENCH-CONVERTER-SW — EVF Workbench - Converts JTAG SVF to National’s EVF2 SCAN Format

Graphical User Interface tool for conversion of SVF files to Texas Instrument’s EVF2 embedded file format. Zip file includes readme file, license file, and setup program (1.6MB)

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