CY29FCT520T-MIL
- Function, Pinout, and Drive Compatible With FCT, F Logic, and AM29520
- Reduced VOH (Typically = 3.3 V) Version of Equivalent FCT Functions
- Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics
- Ioff Supports Partial-Power-Down Mode Operation
- Matched Rise and Fall Times
- Fully Compatible With TTL Input and Output Logic Levels
- ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
- Single- and Dual-Pipeline Operation Modes
- Multiplexed Data Inputs and Outputs
- CY29FCT520T
- 64-mA Output Sink Current
32-mA Output Source Current
- 64-mA Output Sink Current
- CY29FCT520ATDMB, CY29FCT520BTDMB
- 32-mA Output Sink Current
12-mA Output Source Current
- 32-mA Output Sink Current
- 3-State Outputs
The CY29FCT520T is a multilevel 8-bit-wide pipeline register. The device consists of four registers, A1, A2, B1, and B2, which are configured by the instruction inputs I0, I1 as a single four-level pipeline or as two two-level pipelines. The contents of any register can be read at the multiplexed output at any time by using the multiplex-selection controls (S0 and S1).
The pipeline registers are positive-edge triggered, and data is shifted by the rising edge of the clock input. Instruction I = 0 selects the four-level pipeline mode. Instruction I = 1 selects the two-level B pipeline, while I = 2 selects the two-level A pipeline. I = 3 is the hold instruction; no shifting is performed by the clock in this mode.
In the two-level operation mode, data is shifted from level 1 to level 2 and new data is loaded into level 1.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
技術文件
| 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | Multilevel Pipeline Register With 3-State Outputs datasheet (Rev. C) | 2001年 11月 2日 | |
| Selection guide | Logic Guide (Rev. AB) | 2017年 6月 12日 | ||
| Application note | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 2015年 12月 2日 | ||
| User guide | LOGIC Pocket Data Book (Rev. B) | 2007年 1月 16日 | ||
| Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004年 7月 8日 | ||
| Application note | Selecting the Right Level Translation Solution (Rev. A) | 2004年 6月 22日 | ||
| User guide | CYFCT Parameter Measurement Information | 2001年 4月 2日 | ||
| Selection guide | Advanced Bus Interface Logic Selection Guide | 2001年 1月 9日 |
設計與開發
如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 資格摘要
- 進行中可靠性監測
- 晶圓廠位置
- 組裝地點