ISOS141-SEP

現行

Radiation tolerant, quad channel, 3/1 digital isolator

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產品規格表

document-pdfAcrobat ISOS141-SEP Radiation Tolerant High-Speed Quad-Channel Digital Isolator datasheet (英文) PDF | HTML

ISOS141-SEP

現行

立即訂購

產品詳細資料

Rating

Space

Integrated isolated power

No

Number of channels

4

Forward/reverse channels

3 forward / 1 reverse

Data rate (max) (Mbps)

100

Protocols

GPIO, PWM, SPI, UART

SPI frequency (max) (MHz)

15.5

Propagation delay time (typ) (ns)

10.7

Propagation delay time (max) (ns)

16

Channel-to-channel output skew (max) (ns)

4

Certifications

DIN

Isolation rating

Basic

Withstand isolation voltage (VISO) (Vrms)

3000

Surge isolation voltage (VIOSM) (kVPK)

5.2

CMTI (min) (kV/µs)

85

Default output

High, Low

Creepage (min) (mm)

3.7

Current consumption per channel (DC) (typ) (mA)

0.88

Current consumption per channel (1 Mbps) (typ) (mA)

1.48

Operating temperature range (°C)

-55 to 125

Transient isolation voltage (VIOTM) (VPK)

4242

Clearance (min) (mm)

3.7

Rating

Space

Integrated isolated power

No

Number of channels

4

Forward/reverse channels

3 forward / 1 reverse

Data rate (max) (Mbps)

100

Protocols

GPIO, PWM, SPI, UART

SPI frequency (max) (MHz)

15.5

Propagation delay time (typ) (ns)

10.7

Propagation delay time (max) (ns)

16

Channel-to-channel output skew (max) (ns)

4

Certifications

DIN

Isolation rating

Basic

Withstand isolation voltage (VISO) (Vrms)

3000

Surge isolation voltage (VIOSM) (kVPK)

5.2

CMTI (min) (kV/µs)

85

Default output

High, Low

Creepage (min) (mm)

3.7

Current consumption per channel (DC) (typ) (mA)

0.88

Current consumption per channel (1 Mbps) (typ) (mA)

1.48

Operating temperature range (°C)

-55 to 125

Transient isolation voltage (VIOTM) (VPK)

4242

Clearance (min) (mm)

3.7

SSOP (DBQ)

16

29.4 mm² (4.9 mm × 6 mm)

Radiation Tolerant
- Total Ionizing Dose (TID) Characterized (ELDRS-Free) = 30 krad(Si)
- TID RLAT/RHA = 30 krad(Si)
- Single-Event Latch-up (SEL) Immune to LET = 43 MeV⋅cm²/mg at 125°C
- Single-Event Dielectric Rupture (SEDR) Immune (43 MeV⋅cm²/mg) at 500 V_DC
Space Enhanced Plastic (Space EP)
- Meets NASA’s ASTM E595 Outgassing Spec
- Vendor Item Drawing (VID) V62/21610
- Military Temp Range (-55°C to 125°C)
- One Wafer Fabrication Site
- One Assembly and Test Site
- Gold Bond Wire, NiPdAu Lead Finish
- Wafer Lot Traceability
- Extended Product Life Cycle
- Extended Product Change Notification
600 V_RMS continous working voltage
Section 6.7:
- DIN VDE V 0884-11:2017-01
- UL 1577 component recognition program
100 Mbps data rate
Wide supply range: 2.25 V to 5.5 V
2.25-V to 5.5-V level translation
Default output low
Low power consumption, 1.5 mA per channel typical at 1 Mbps
Low propagation delay: 10.7 ns typical (5-V Supplies)
Low channel-to-channel skew: 4 ns max (5-V Supplies)
±100 kV/µs typical CMTI
System-level ESD, EFT, Surge, and Magnetic Immunity
Small QSOP (DBQ-16) package

Radiation Tolerant
- Total Ionizing Dose (TID) Characterized (ELDRS-Free) = 30 krad(Si)
- TID RLAT/RHA = 30 krad(Si)
- Single-Event Latch-up (SEL) Immune to LET = 43 MeV⋅cm²/mg at 125°C
- Single-Event Dielectric Rupture (SEDR) Immune (43 MeV⋅cm²/mg) at 500 V_DC
Space Enhanced Plastic (Space EP)
- Meets NASA’s ASTM E595 Outgassing Spec
- Vendor Item Drawing (VID) V62/21610
- Military Temp Range (-55°C to 125°C)
- One Wafer Fabrication Site
- One Assembly and Test Site
- Gold Bond Wire, NiPdAu Lead Finish
- Wafer Lot Traceability
- Extended Product Life Cycle
- Extended Product Change Notification
600 V_RMS continous working voltage
Section 6.7:
- DIN VDE V 0884-11:2017-01
- UL 1577 component recognition program
100 Mbps data rate
Wide supply range: 2.25 V to 5.5 V
2.25-V to 5.5-V level translation
Default output low
Low power consumption, 1.5 mA per channel typical at 1 Mbps
Low propagation delay: 10.7 ns typical (5-V Supplies)
Low channel-to-channel skew: 4 ns max (5-V Supplies)
±100 kV/µs typical CMTI
System-level ESD, EFT, Surge, and Magnetic Immunity
Small QSOP (DBQ-16) package

The ISOS141-SEP radiation-tolerant device is a high-performance, quad-channel digital isolator in a small form factor 16-pin QSOP package. Each isolation channel has a logic input and output buffer separated by a double capacitive silicon dioxide (SiO₂) insulation barrier. This device supports low Earth orbit (LEO) space applications with its high data rate of 100 Mbps, low propagation delay of 10.7 ns, and tight channel-to-channel skew of 4 ns. The ISOS141-SEP device has three forward and one reverse-direction channels and if the input power or signal is lost, the default output is low. The enable pins can be used to put the respective outputs in high impedance for multi-master driving applications and to reduce power consumption.

The ISOS141-SEP provides high electromagnetic immunity and low emissions with low power consumption, while isolating CMOS or LVCMOS digital I/Os. The device has a high common-mode transient immunity of 100 kV/µs and can ease system-level ESD, EFT, surge, and simplify emissions compliance through its innovative chip design.

The ISOS141-SEP radiation-tolerant device is a high-performance, quad-channel digital isolator in a small form factor 16-pin QSOP package. Each isolation channel has a logic input and output buffer separated by a double capacitive silicon dioxide (SiO₂) insulation barrier. This device supports low Earth orbit (LEO) space applications with its high data rate of 100 Mbps, low propagation delay of 10.7 ns, and tight channel-to-channel skew of 4 ns. The ISOS141-SEP device has three forward and one reverse-direction channels and if the input power or signal is lost, the default output is low. The enable pins can be used to put the respective outputs in high impedance for multi-master driving applications and to reduce power consumption.

The ISOS141-SEP provides high electromagnetic immunity and low emissions with low power consumption, while isolating CMOS or LVCMOS digital I/Os. The device has a high common-mode transient immunity of 100 kV/µs and can ease system-level ESD, EFT, surge, and simplify emissions compliance through its innovative chip design.

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重要文件	類型	標題	格式選項	下載最新的英文版本
*	資料表	ISOS141-SEP Radiation Tolerant High-Speed Quad-Channel Digital Isolator datasheet	PDF \| HTML		2021/3/5
*	輻射及可靠性報告	ISOS141-SEP Production Flow and Reliability Report (Rev. A)	PDF \| HTML		2025/6/5
*	輻射及可靠性報告	ISOS141-SEP Neutron Displacement Damage Characterization			2021/3/18
*	輻射及可靠性報告	ISOS141-SEP Quad-Channel Digital Isolator TID Report			2021/3/17
*	輻射及可靠性報告	ISOS141-SEP Single-Event Latch-Up (SEL) Radiation Report			2021/3/17
	證書	VDE Certificate for Basic Isolation for DIN EN IEC 60747-17 (Rev. AA)			2026/6/11
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