Adjacent Channel Power Ratio (ACPR) and Error Vector Magnitude (%EVM) Measurements
TIDA-00076
This product has been released to the market and is available for purchase. For some products, newer alternatives may be available.
This product has been released to the market and is available for purchase. For some products, newer alternatives may be available.
See the Important Notice and Disclaimer covering reference designs and other TI resources.
Description
This reference design discusses the use of the TSW3085EVM with the TSW3100 pattern generator to test adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements of LTE baseband signals. By using the TSW3100 LTE GUI, patterns are loaded into the TSW3085EVM which is comprised of the DAC3482, TRF3705, and LMK04806.
Features
- Hardware reference design and Demonstration platform for a complete digital to RF transmitter
- A Process and setup to test performance metrics for modulated signals such as Error vector Magnitude (%EVM) and Adjacent Channel Power Ratio (ACPR) are provided
- Results are tabulated for external clocking of the DAC and also for using the internal PLL of the DAC
- An easy to use evaluation platform to make standards compliant measurements
See the Important Notice and Disclaimer covering reference designs and other TI resources.
