20-bit, 1-MSPS, 4-Ch Small Form Factor Design for Test and Measurement Applications Reference Design
TIPD211
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Key Document
- 20-Bit, 1-MSPS, 4-Ch Small-Form Factor Design for Test and Measurements (Rev. B)
(PDF 2610 KB)
28 Nov 2016
Description
End equipment such as mixed signal SOC testers, memory testers, battery testers, liquid-crystal display (LCD) testers, benchtop equipment, high-density digital cards, high-density power cards, x-Ray, MRI, and so forth require multiple, fast, simultaneous sampling channels with excellent DC and AC performance but at low power and in small board spaces. The proposed solution in this design uses high-performance SAR ADCs (ADS8910B), precision amplifiers (OPA2625), and a precision voltage reference (REF5050).
Features
- 18 bit 1 MSPS 4 Channel Simultaneous Sampling Data Acquisition system
- 18 bit NMC DNL; +/- 0.5 LSB INL linearity performance for each channel
- 101dB SNR, 124dB THD with 2kHz Sine wave input on each channel
- >110dB Channel to Channel Isolation
- This circuit design is tested and includes Getting Started guide.
See the Important Notice and Disclaimer covering reference designs and other TI resources.