TIDA-00070
用於量測類比數位轉換器輸出字中的位元錯誤的 FPGA 韌體專案
TIDA-00070
概覽
For applications where there are bit errors and resulting sample errors (also called sparkle codes, word errors, or code errors), the ability to measure the Error rates caused by these bit errors is important. This FPGA firmware based application note proposes a method to accurately measure these errors over an indefinite time and provides an example of how this measurement can be done using a simple FPGA platform. Code is available on request for the two examples described in the application note.
特點
- Understand how Error Rates are specified and what these specifications mean
- Outline new approach to measuring the sample errors over an indefinite time period to measure the true error rate of an ADC
- Provide customers the ability to make bit error measurements on their bench under different conditions
- Firmware is available for low cost FPGA platfrom TI along with simple GUI to monitor the error rates over time
已開發完全組裝的電路板，僅供測試與性能驗證，且為非賣品。
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| 類型 | 標題 | 下載最新的英文版本 | 日期 | |||
|---|---|---|---|---|---|---|
| 使用指南 | TIDA-00070 Verified Design Reference Guide | 2013/1/23 |