SCAS931G May   2012  – January 2018 CDCM6208

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
    1.     Device Images
      1.      Simplified Schematic
      2.      Simplified Schematic
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information, Airflow = 0 LFM
    5. 6.5  Thermal Information, Airflow = 150 LFM
    6. 6.6  Thermal Information, Airflow = 250 LFM
    7. 6.7  Thermal Information, Airflow = 500 LFM
    8. 6.8  Single-Ended Input Characteristics (SI_MODE[1:0], SDI/SDA/PIN1, SCL/PIN4, SDO/ADD0/PIN2, SCS/ADD1/PIN3, STATUS1/PIN0, RESETN/PWR, PDN, SYNCN, REF_SEL)
    9. 6.9  Single-Ended Input Characteristics (PRI_REF, SEC_REF)
    10. 6.10 Differential Input Characteristics (PRI_REF, SEC_REF)
    11. 6.11 Crystal Input Characteristics (SEC_REF)
    12. 6.12 Single-Ended Output Characteristics (STATUS1, STATUS0, SDO, SDA)
    13. 6.13 PLL Characteristics
    14. 6.14 LVCMOS Output Characteristics
    15. 6.15 LVPECL (High-Swing CML) Output Characteristics
    16. 6.16 CML Output Characteristics
    17. 6.17 LVDS (Low-Power CML) Output Characteristics
    18. 6.18 HCSL Output Characteristics
    19. 6.19 Output Skew and Sync to Output Propagation Delay Characteristics
    20. 6.20 Device Individual Block Current Consumption
    21. 6.21 Worst Case Current Consumption
    22. 6.22 Timing Requirements, I2C Timing
    23. 6.23 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Typical Device Jitter
      2. 8.3.2  Universal Input Buffer (PRI_REF, SEC_REF)
      3. 8.3.3  VCO Calibration
      4. 8.3.4  Reference Divider (R)
      5. 8.3.5  Input Divider (M)
      6. 8.3.6  Feedback Divider (N)
      7. 8.3.7  Prescaler Dividers (PS_A, PS_B)
      8. 8.3.8  Phase Frequency Detector (PFD)
      9. 8.3.9  Charge Pump (CP)
      10. 8.3.10 Fractional Output Divider Jitter Performance
      11. 8.3.11 Device Block-Level Description
      12. 8.3.12 Device Configuration Control
      13. 8.3.13 Configuring the RESETN Pin
      14. 8.3.14 Preventing False Output Frequencies in SPI/I2C Mode at Start-Up
      15. 8.3.15 Input MUX and Smart Input MUX
    4. 8.4 Device Functional Modes
      1. 8.4.1 Control Pins Definition
      2. 8.4.2 Loop Filter Recommendations for Pin Modes
      3. 8.4.3 Status Pins Definition
      4. 8.4.4 PLL Lock Detect
      5. 8.4.5 Interface and Control
        1. 8.4.5.1 Register File Reference Convention
        2. 8.4.5.2 SPI - Serial Peripheral Interface
          1. 8.4.5.2.1 Writing to the CDCM6208
          2. 8.4.5.2.2 Reading From the CDCM6208
          3. 8.4.5.2.3 Block Write/Read Operation
          4. 8.4.5.2.4 I2C Serial Interface
    5. 8.5 Programming
    6. 8.6 Register Maps
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedures
        1. 9.2.2.1  Jitter Considerations in SERDES Systems
        2. 9.2.2.2  Jitter Considerations in ADC and DAC Systems
        3. 9.2.2.3  Configuring the PLL
        4. 9.2.2.4  Programmable Loop Filter
        5. 9.2.2.5  Loop filter Component Selection
        6. 9.2.2.6  Device Output Signaling
        7. 9.2.2.7  Integer Output Divider (IO)
        8. 9.2.2.8  Fractional Output Divider (FOD)
        9. 9.2.2.9  Output Synchronization
        10. 9.2.2.10 Output Mux on Y4 and Y5
        11. 9.2.2.11 Staggered CLK Output Power Up for Power Sequencing of a DSP
  10. 10Power Supply Recommendations
    1. 10.1 Power Rail Sequencing, Power Supply Ramp Rate, and Mixing Supply Domains
      1. 10.1.1 Mixing Supplies
      2. 10.1.2 Power-On Reset
      3. 10.1.3 Slow Power-Up Supply Ramp
      4. 10.1.4 Fast Power-Up Supply Ramp
      5. 10.1.5 Delaying VDD_Yx_Yy to Protect DSP IOs
    2. 10.2 Device Power-Up Timing
    3. 10.3 Power Down
    4. 10.4 Power Supply Ripple Rejection (PSRR) versus Ripple Frequency
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Reference Schematics
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Revision History

Changes from F Revision (April 2014) to G Revision

Changes from E Revision (March 2013) to F Revision

  • Changed layout of data sheet to conform to new TI standards. Added the following sections: Handling Ratings, Thermal Information, Typical Characteristics, Programming, Register Maps, Layout and Layout Guidelines Go
  • Changed from zero to one Go
  • Added text at the end of the first paragraph in Power Down section Go
  • Changed fOUT = 122.88 MHz, VDD Supply Noise = 100 mVppGo

Changes from D Revision (March 2013) to E Revision

  • Added the Handling Ratings tableGo
  • Changed Pullup and Pulldown value From: MIN = 40 To: 35 kΩ and MAX = 60 To: 65 kΩ Go
  • Changed the from Random Jitter, Maximum in Table 2 From: 10k - 20MHZ To: 12k - 20MHZ and From: 0.5 ps-rms (int div) To: 0.3 ps-rms (int div) Go
  • Added new Note 1 to Table 2Go

Changes from C Revision (September 2012) to D Revision

  • Changed the Description of pin VDD_PRI_REFGo
  • Changed the Description of pin VDD_SEC_REFGo
  • Changed Figure 35Go
  • Changed Table 6 - Note 2 and row 10 - 0x1C, PinMode 29-V1, fout(Y7) From: 33.33 To: 44.44Go
  • Changed Table 8 - Note 2 and row 10 - 0x13, PinMode 20-V2, fout(Y7) From: 25 To: 12.5Go
  • Changed text in the PLL lock detect section From: "1/1000 th of the input reference frequency" To: "1/1000 th of the PFD update frequency"Go
  • Changed text in the PLL lock detect section From: "approximately 1000 input clock cycles" To: "approximately 1000 PFD update clock cycles"Go
  • Changed Figure 60, From: PDN held Low To: RESETN held lowGo
  • Changed Equation 4Go

Changes from B Revision (August 2012) to C Revision

  • Changed Table 39, 2:0 DIE_REVISION DescriptionGo
  • Added text "Example: SERDES link with KeyStone™ I DSP"Go

Changes from A Revision (June 2012) to B Revision

  • Changed the Description of pin VDD_PRI_REFGo
  • Changed the Description of pin VDD_SEC_REFGo
  • Added Table Note 1 to the description of pin 44.Go
  • Added Note to the Preventing false output frequencies in SPI/I2C mode at startup: sectionGo
  • Changed the NOTE following Table 12Go
  • Added Note to the I2C SERIAL INTERFACE sectionGo
  • Deleted text "All outputs PECL (Y4:0) and LVDS (Y7:4)." from the Conclusion statementGo
  • Changed the text in the OUTPUT MUX on Y4 and Y5 sectionGo
  • Changed the text in item 1 of the Staggered CLK output powerup for power sequencing of a DSP sectionGo
  • Changed the first paragraph in the Power Down sectionGo
  • Changed the first paragraph in the Power Supply Ripple Rejection (PSRR) versus Ripple Frequency sectionGo

Changes from * Revision (May 2012) to A Revision

  • Section Header From: RESTN, PWR, SYNC To: RESETN, PWR, SYNCN, PDN, REF_SEL, SI_MODE[1:0]Go
  • Changed the RPULLUP parametres From: RPULLUP - Input Pullup Resistor To: R - Input Pullup and Pulldown ResistorGo