SLASF63 june   2023 DAC539E4W

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics: Threshold DAC
    6. 6.6  Electrical Characteristics: Comparator
    7. 6.7  Electrical Characteristics: General
    8. 6.8  Timing Requirements: I2C Standard Mode
    9. 6.9  Timing Requirements: I2C Fast Mode
    10. 6.10 Timing Requirements: I2C Fast Mode Plus
    11. 6.11 Timing Requirements: SPI Write Operation
    12. 6.12 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 0)
    13. 6.13 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 1)
    14. 6.14 Timing Diagrams
    15. 6.15 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Smart Digital-to-Analog Converter (DAC) Architecture
      2. 7.3.2 Threshold DAC
        1. 7.3.2.1 Voltage Reference and DAC Transfer Function
          1. 7.3.2.1.1 Power-Supply as Reference
          2. 7.3.2.1.2 Internal Reference
          3. 7.3.2.1.3 External Reference
      3. 7.3.3 Look-Up Table (LUT)
      4. 7.3.4 Programming Interface
      5. 7.3.5 Nonvolatile Memory (NVM)
        1. 7.3.5.1 NVM Cyclic Redundancy Check (CRC)
          1. 7.3.5.1.1 NVM-CRC-FAIL-USER Bit
          2. 7.3.5.1.2 NVM-CRC-FAIL-INT Bit
      6. 7.3.6 Power-On Reset (POR)
      7. 7.3.7 External Reset
      8. 7.3.8 Register-Map Lock
    4. 7.4 Device Functional Modes
      1. 7.4.1 Comparator Mode
        1. 7.4.1.1 Programmable Hysteresis Comparator
      2. 7.4.2 Power-Down Mode
    5. 7.5 Programming
      1. 7.5.1 SPI Programming Mode
      2. 7.5.2 I2C Programming Mode
        1. 7.5.2.1 F/S Mode Protocol
        2. 7.5.2.2 I2C Update Sequence
          1. 7.5.2.2.1 Address Byte
          2. 7.5.2.2.2 Command Byte
        3. 7.5.2.3 I2C Read Sequence
    6. 7.6 Register Maps
      1. 7.6.1  NOP Register (address = 00h) [reset = 0000h]
      2. 7.6.2  DAC-x-MARGIN-HIGH Register (address = 01h, 07h, 0Dh, 13h) [reset = 0000h]
      3. 7.6.3  DAC-x-MARGIN-LOW Register (address = 02h, 08h, 0Eh, 14h) [reset = 0000h]
      4. 7.6.4  DAC-x-VOUT-CMP-CONFIG Register (address = 03h, 09h, 0Fh, 15h) [reset = 0401h]
      5. 7.6.5  DAC-x-CMP-MODE-CONFIG Register (address = 05h, 0Bh, 11h, 17h) [reset = 0000h]
      6. 7.6.6  COMMON-CONFIG Register (address = 1Fh) [reset = 1249h]
      7. 7.6.7  COMMON-TRIGGER Register (address = 20h) [reset = 0000h]
      8. 7.6.8  COMMON-DAC-TRIG Register (address = 21h) [reset = 0000h]
      9. 7.6.9  GENERAL-STATUS Register (address = 22h) [reset = 00h, DEVICE-ID, VERSION-ID]
      10. 7.6.10 CMP-STATUS Register (address = 23h) [reset = 0000h]
      11. 7.6.11 DEVICE-MODE-CONFIG Register (address = 25h) [reset = 8040h]
      12. 7.6.12 INTERFACE-CONFIG Register (address = 26h) [reset = 0000h]
      13. 7.6.13 STATE-MACHINE-CONFIG0 Register (address = 27h) [reset = 0003h]
      14. 7.6.14 SRAM-CONFIG Register (address = 2Bh) [reset = 0000h]
      15. 7.6.15 SRAM-DATA Register (address = 2Ch) [reset = 0000h]
      16. 7.6.16 DAC-x-DATA Register (SRAM address = 21h, 22h, 23h, 24h) [reset = 8000h]
      17. 7.6.17 LUT-x-DATA Register (SRAM address = 25h through 34h) [reset = (see register description)]
      18. 7.6.18 LOOP-WAIT Register (SRAM address = 35h) [reset = 0000h]
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • YBH|16
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD Supply voltage, VDD to AGND –0.3 6 V
Digital inputs to AGND –0.3 VDD + 0.3 V
VAINX to AGND –0.3 VDD + 0.3 V
VOUTX to AGND –0.3 VDD + 0.3 V
VREF External reference, VREF to AGND –0.3 VDD + 0.3 V
Current into any pin except the OUTx, VDD, and AGND pins –10 10 mA
TJ Junction temperature –40 150 °C
Tstg Storage temperature –65 150 °C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.