Produktdetails

Technology family TTL Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 62000
Technology family TTL Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 62000
CDIP (J) 16 135.3552 mm² 19.56 x 6.92 CFP (W) 16 69.319 mm² 10.3 x 6.73
  • '46A, '47A, 'LS47 feature
    • Open-Collector Outputs Drive Indicators Directly
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • '48, 'LS48 feature
    • Internal Pull-Ups Eliminate Need for External Resistors
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • 'LS49 feature
    • Open-Collector Outputs
    • Blanking Input
  • All Circuit Types Feature Lamp Intensity Modulation Capability
  • '46A, '47A, 'LS47 feature
    • Open-Collector Outputs Drive Indicators Directly
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • '48, 'LS48 feature
    • Internal Pull-Ups Eliminate Need for External Resistors
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • 'LS49 feature
    • Open-Collector Outputs
    • Blanking Input
  • All Circuit Types Feature Lamp Intensity Modulation Capability

The '46A, '47A, and 'LS47 feature active-low outputs designed for driving, common-anode LEDs or incandescent indicators directly. The '48, 'LS48, and 'LS49 feature active-high outputs for driving lamp buffers or common-cathode LEDs. All of the circuits except 'LS49 have full ripple-blanking input/output controls and a lamp test input. The 'LS49 circuit incorporates a direct blanking input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.

The '46A, '47A, '48, 'LS47, and 'LS48 circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types (including the '49 and 'LS49) contain an overriding blanking input (BI\), which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.

The SN54246/SN74246 and '247 and the SN54LS247/SN74LS247 and 'LS248 compose the 6 and the 9 with tails and were designed to offer the designer a choice between two indicator fonts.

The '46A, '47A, and 'LS47 feature active-low outputs designed for driving, common-anode LEDs or incandescent indicators directly. The '48, 'LS48, and 'LS49 feature active-high outputs for driving lamp buffers or common-cathode LEDs. All of the circuits except 'LS49 have full ripple-blanking input/output controls and a lamp test input. The 'LS49 circuit incorporates a direct blanking input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.

The '46A, '47A, '48, 'LS47, and 'LS48 circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types (including the '49 and 'LS49) contain an overriding blanking input (BI\), which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.

The SN54246/SN74246 and '247 and the SN54LS247/SN74LS247 and 'LS248 compose the 6 and the 9 with tails and were designed to offer the designer a choice between two indicator fonts.

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Technische Dokumentation

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Typ Titel Datum
* Data sheet BCD-to-Seven-Segment Decoders/Drivers datasheet 01 Mär 1988
* SMD SN5447A SMD 5962-98564 21 Jun 2016
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dez 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
Application note Designing With Logic (Rev. C) 01 Jun 1997
Application note Input and Output Characteristics of Digital Integrated Circuits 01 Okt 1996
Application note Live Insertion 01 Okt 1996

Design und Entwicklung

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Gehäuse Pins Herunterladen
CDIP (J) 16 Optionen anzeigen
CFP (W) 16 Optionen anzeigen

Bestellen & Qualität

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  • Materialinhalt
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  • Kontinuierliches Zuverlässigkeitsmonitoring
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  • Montagestandort

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