SLLS897E March 2008 – June 2015 ISO1176
Any cabled I/O can be subjected to electrical noise transients from various sources. These noise transients can cause damage to the transceiver and/or nearby sensitive circuitry if they are of sufficient magnitude and duration. The ISO1176 can significantly reduce the risk of data corruption and damage to expensive control circuits.
The device is characterized for operation over the ambient temperature range of –40°C to +85°C.