SLLS897E March   2008  – June 2015 ISO1176

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Description (continued)
  6. Pin Configuration and Functions
  7. Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics: ISODE-Pin
    6. 7.6  Supply Current
    7. 7.7  Electrical Characteristics: Driver
    8. 7.8  Electrical Characteristics: Receiver
    9. 7.9  Power Dissipation Characteristics
    10. 7.10 Switching Characteristics: Driver
    11. 7.11 Switching Characteristics: Receiver
    12. 7.12 Typical Characteristics
  8. Parameter Measurement Information
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Insulation and Safety-Related Package Characteristics
      2. 9.3.2 DIN V VDE V 0884-10 Insulation Characteristics
      3. 9.3.3 IEC 60664-1 Ratings Table
      4. 9.3.4 Safety Limiting Values
      5. 9.3.5 Regulatory Information
    4. 9.4 Device Functional Modes
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
        1. 10.2.2.1 Transient Voltages
        2. 10.2.2.2 ISO1176 “Sticky Bit” Issue (Under Certain Conditions)
      3. 10.2.3 Application Curve
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 Community Resources
    3. 13.3 Trademarks
    4. 13.4 Electrostatic Discharge Caution
    5. 13.5 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8 Parameter Measurement Information

ISO1176 opn_tst_cir_lls897.gifFigure 8. Open Circuit Voltage Test Circuit
ISO1176 vod_tst_cir_lls897.gifFigure 9. VOD Test Circuit
ISO1176 vod_load_lls897.gifFigure 10. Driver VOD With Common-Mode Loading Test Circuit
ISO1176 vod_vco_ld_lls897.gifFigure 11. Driver VOD and VOC Without Common-Mode Loading Test Circuit
ISO1176 steady_st_lls897.gifFigure 12. Steady-State Output Voltage Test Circuit and Voltage Waveforms
ISO1176 wf_def_lls897.gifFigure 13. VOD(RING) Waveform and Definitions
ISO1176 hys_tst_cir_lls897.gifFigure 14. Input Voltage Hysteresis Test Circuit
ISO1176 drv_sho_cir_lls897.gifFigure 15. Driver Short-Circuit Test Circuit and Waveforms (Short-Circuit Applied at Time t=0)
ISO1176 stdy_op_cur_lls897.gifFigure 16. IOS(SS) Steady State Short-Circuit Output Current Test Circuit
ISO1176 drv_swt_lls897.gifFigure 17. Driver Switching Test Circuit and Waveforms
ISO1176 drv_trns_lls897.gifFigure 18. Driver Output Transition Skew Test Circuit and Waveforms
ISO1176 dvr_enable_lls897.gifFigure 19. Driver Enable and Disable Test, D at Logic Low Test Circuit and Waveforms
ISO1176 drv_enable2_lls897.gifFigure 20. Driver Enable and Disable Test, D at Logic High Test Circuit and Waveforms
ISO1176 prop_dly_lls897.gifFigure 21. DE to ISODE Prop Delay Test Circuit and Waveforms
ISO1176 rec_def_lls897.gifFigure 22. Receiver DC Parameter Definitions
ISO1176 rec_swt_lls897.gifFigure 23. Receiver Switching Test Circuit and Waveforms
ISO1176 rec_enable_lls897.gifFigure 24. Receiver Enable Test Circuit and Waveforms, Data Output High
ISO1176 data_outl_lls897.gifFigure 25. Receiver Enable Test Circuit and Waveforms, Data Output Low
ISO1176 cmmr_tst_lls897.gifFigure 26. Common-Mode Rejection Test Circuit
ISO1176 immu_tst_lls897.gifFigure 27. Common-Mode Transient Immunity Test Circuit