SLLSG36 April 2025 ISO6540-Q1 , ISO6541-Q1 , ISO6542-Q1
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| VOH | High-level output voltage | IOH = -1mA; See Section 6 | VCCO - 0.1 (1) | V | ||
| VOL | Low-level output voltage | IOL = 1mA; See Section 6 | 0.1 | V | ||
| VIT+(IN) | Rising input switching threshold | 0.7 × VCCI(1) | V | |||
| VIT-(IN) | Falling input switching threshold | 0.3 × VCCI | V | |||
| VI(HYS) | Input threshold voltage hysteresis | 0.1 × VCCI | V | |||
| IIH | High-level input current | VIH = VCCI(1) at INx | 10 | µA | ||
| IIL | Low-level input current | VIL = 0 V at INx | -10 | µA | ||
| IIH | High-level input current | VIH = VCCI (1) at ENx | 30 | µA | ||
| IIL | Low-level input current | VIL = 0 V at ENx | -30 | µA | ||
| CMTI | Common mode transient immunity | VI = VCC or 0 V, VCM = 1200 V; See Section 6 | 100 | 150 | kV/µA | |
| Ci | Input Capacitance (2) | VI = VCC/ 2 + 0.4×sin(2πft), f = 2 MHz, VCC = 2.5 V | 2.8 | pF | ||