SNVS345G June 2006 – December 2014 LP5951
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For the availability of evaluation boards, see the LP5951 product folder. For information regarding evaluation boards, see the TI AN-1486 Application Report LP5951 Evaluation Board (SNVA169).
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.