SBOSA15B September   2022  – January 2025 TMP1827

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Description (cont.)
  6. 5 Device Comparison
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics
    6. 7.6  1-Wire® Interface Timing
    7. 7.7  Security Engine Characteristics
    8. 7.8  EEPROM Characteristics
    9. 7.9  Timing Diagrams
    10. 7.10 Typical Characteristics
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Power Up
      2. 8.3.2  Power Mode Switch
      3. 8.3.3  Bus Pullup Resistor
      4. 8.3.4  Temperature Results
      5. 8.3.5  Temperature Offset
      6. 8.3.6  Temperature Alert
      7. 8.3.7  Standard Device Address
        1. 8.3.7.1 Unique 64-Bit Device Address and ID
      8. 8.3.8  Flexible Device Address
        1. 8.3.8.1 Non-Volatile Short Address
        2. 8.3.8.2 IO Hardware Address
        3. 8.3.8.3 Resistor Address
        4. 8.3.8.4 Combined IO and Resistor Address
      9. 8.3.9  CRC Generation
      10. 8.3.10 Functional Register Map
      11. 8.3.11 User Memory Map
      12. 8.3.12 SHA-256-HMAC Authentication Block
      13. 8.3.13 Bit Communication
        1. 8.3.13.1 Host Write, Device Read
        2. 8.3.13.2 Host Read, Device Write
      14. 8.3.14 Bus Speed
      15. 8.3.15 NIST Traceability
    4. 8.4 Device Functional Modes
      1. 8.4.1 Conversion Modes
        1. 8.4.1.1 Basic One-Shot Conversion Mode
        2. 8.4.1.2 Auto Conversion Mode
        3. 8.4.1.3 Stacked Conversion Mode
        4. 8.4.1.4 Continuous Conversion Mode
      2. 8.4.2 Alert Function
        1. 8.4.2.1 Alert Mode
        2. 8.4.2.2 Comparator Mode
      3. 8.4.3 1-Wire® Interface Communication
        1. 8.4.3.1 Bus Reset Phase
        2. 8.4.3.2 Address Phase
          1. 8.4.3.2.1 READADDR (33h)
          2. 8.4.3.2.2 MATCHADDR (55h)
          3. 8.4.3.2.3 SEARCHADDR (F0h)
          4. 8.4.3.2.4 ALERTSEARCH (ECh)
          5. 8.4.3.2.5 SKIPADDR (CCh)
          6. 8.4.3.2.6 OVD SKIPADDR (3Ch)
          7. 8.4.3.2.7 OVD MATCHADDR (69h)
          8. 8.4.3.2.8 FLEXADDR (0Fh)
        3. 8.4.3.3 Function Phase
          1. 8.4.3.3.1  CONVERTTEMP (44h)
          2. 8.4.3.3.2  WRITE SCRATCHPAD-1 (4Eh)
          3. 8.4.3.3.3  READ SCRATCHPAD-1 (BEh)
          4. 8.4.3.3.4  COPY SCRATCHPAD-1 (48h)
          5. 8.4.3.3.5  WRITE SCRATCHPAD-2 (0Fh)
          6. 8.4.3.3.6  READ SCRATCHPAD-2 (AAh)
          7. 8.4.3.3.7  COPY SCRATCHPAD-2 (55h)
          8. 8.4.3.3.8  READ EEPROM (F0h)
          9. 8.4.3.3.9  GPIO WRITE (A5h)
          10. 8.4.3.3.10 GPIO READ (F5h)
      4. 8.4.4 NVM Operations
        1. 8.4.4.1 Programming User Data
        2. 8.4.4.2 Register and Memory Protection
          1. 8.4.4.2.1 Scratchpad-1 Register Protection
          2. 8.4.4.2.2 User Memory Protection
    5. 8.5 Programming
      1. 8.5.1 Single Device Temperature Conversion and Read
      2. 8.5.2 Multiple Device Temperature Conversion and Read
      3. 8.5.3 Register Scratchpad-1 Update and Commit
      4. 8.5.4 Single Device EEPROM Programming and Verify
      5. 8.5.5 Single Device EEPROM Page Lock Operation
      6. 8.5.6 Multiple Device IO Read
      7. 8.5.7 Multiple Device IO Write
    6. 8.6 Register Map
      1. 8.6.1  Temperature Result LSB Register (Scratchpad-1 offset = 00h) [reset = 00h]
      2. 8.6.2  Temperature Result MSB Register (Scratchpad-1 offset = 01h) [reset = 00h]
      3. 8.6.3  Status Register (Scratchpad-1 offset = 02h) [reset = 3Ch]
      4. 8.6.4  Device Configuration-1 Register (Scratchpad-1 offset = 04h) [reset = 70h]
      5. 8.6.5  Device Configuration-2 Register (Scratchpad-1 offset = 05h) [reset = 80h]
      6. 8.6.6  Short Address Register (Scratchpad-1 offset = 06h) [reset = 00h]
      7. 8.6.7  Temperature Alert Low LSB Register (Scratchpad-1 offset = 08h) [reset = 00h]
      8. 8.6.8  Temperature Alert Low MSB Register (Scratchpad-1 offset = 09h) [reset = 00h]
      9. 8.6.9  Temperature Alert High LSB Register (Scratchpad-1 offset = 0Ah) [reset = F0h]
      10. 8.6.10 Temperature Alert High MSB Register (Scratchpad-1 offset = 0Bh) [reset = 07h]
      11. 8.6.11 Temperature Offset LSB Register (Scratchpad-1 offset = 0Ch) [reset = 00h]
      12. 8.6.12 Temperature Offset MSB Register (Scratchpad-1 offset = 0Dh) [reset = 00h]
      13. 8.6.13 IO Read Register [reset = F0h]
      14. 8.6.14 IO Configuration Register [reset = 00h]
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Bus Powered Application
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
      2. 9.2.2 Supply Powered Application
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
      3. 9.2.3 UART Interface for Communication
        1. 9.2.3.1 Design Requirements
        2. 9.2.3.2 Detailed Design Procedure
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.6 1-Wire® Interface Timing

Over free-air temperature range and VDD = 1.70 V to 5.5 V (unless otherwise noted)
STANDARD MODE OVERDRIVE MODE UNIT
MIN MAX MIN MAX
BUS RESET AND BIT SLOT TIMING
tRSTL Host to device bus reset pulse width (Figure 7-1)(1) 480 560 48 80 µs
tRSTH Device to host response time (Figure 7-1)(2) 480 48 µs
tPDH Device turnaround time for bus reset response (Figure 7-1) 15 60 2 8 µs
tPDL Device to host response pulse width (Figure 7-1) 60 240 8 24 µs
tSLOT Bit slot time (Figure 7-2, Figure 7-3)(5) tWR0L + tRC tWR0L + tRC µs
tREC Recovery time (Figure 7-2, Figure 7-3) 2 2 µs
tGF Glitch filter width (Figure 7-6)(3) 0.48 0.025 µs
tF Fall time 100 100 ns
BIT WRITE TIMING
tWR0L Host write 0 width (Figure 7-2) 60 120 9 10 µs
tWR1L Host write 1 width (Figure 7-2) 2 15 1 2 µs
tRDV Device read data valid time (Figure 7-2) 15 2 µs
tDSW Device read data window (Figure 7-2) 15 45 2 7 µs
BIT READ TIMING
tRL Host drive read bit slot time (Figure 7-3)(4) 2.5 5 2 3 µs
tRWAIT Host wait time before read data sampling window (Figure 7-3)(5) tRL+tRC tRL+tRC µs
tMSW Host read data sampling window (Figure 7-3)(5) tRL+tRC 30 tRL+tRC 3 µs
(1) In bus powered mode, extending the tRSTL above 600 µs can cause the device to power on reset
(2) The tRSTH is the maximum time the host must wait to receive a response from the furthest device, taking into account the propagation delay and recovery time for all the devices.
(3) The glitch filter timing applies only on the rising edge of the SDQ signal
(4) tRL minimum time includes the glitch filter timing
(5) The tRC time is defined as the time taken for the bus voltage to rise from 0V to minimum VIH of the device. This is a function of the bus pullup resistor, devices and parasitic capacitance of the trace or cable. The parameters must be characterized for the application.