JAJSLB2D november   2014  – april 2023 DLP9500UV

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 概要 (続き)
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  Storage Conditions
    3. 7.3  ESD Ratings
    4. 7.4  Recommended Operating Conditions
    5. 7.5  Thermal Information
    6. 7.6  Electrical Characteristics
    7. 7.7  LVDS Timing Requirements
    8. 7.8  LVDS Waveform Requirements
    9. 7.9  Serial Control Bus Timing Requirements
    10. 7.10 Systems Mounting Interface Loads
    11. 7.11 Micromirror Array Physical Characteristics
    12. 7.12 Micromirror Array Optical Characteristics
    13. 7.13 Chipset Component Usage Specification
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 DLPC410 - Digital Controller for DLP Discovery 4100 Chipset
      2. 8.3.2 DLPA200 - DMD Micromirror Drivers
      3. 8.3.3 DLPR410 - PROM for DLP Discovery 4100 Chipset
      4. 8.3.4 DLP9500 - DLP 0.95 1080p 2xLVDS UV Type-A DMD 1080p DMD
        1. 8.3.4.1 DLP9500UV 1080p Chipset Interfaces
          1. 8.3.4.1.1 DLPC410 Interface Description
            1. 8.3.4.1.1.1 DLPC410 IO
            2. 8.3.4.1.1.2 Initialization
            3. 8.3.4.1.1.3 DMD Device Detection
            4. 8.3.4.1.1.4 Power Down
          2. 8.3.4.1.2 DLPC410 to DMD Interface
            1. 8.3.4.1.2.1 DLPC410 to DMD IO Description
            2. 8.3.4.1.2.2 Data Flow
          3. 8.3.4.1.3 DLPC410 to DLPA200 Interface
            1. 8.3.4.1.3.1 DLPA200 Operation
            2. 8.3.4.1.3.2 DLPC410 to DLPA200 IO Description
          4. 8.3.4.1.4 DLPA200 to DLP9500UV Interface
            1. 8.3.4.1.4.1 DLPA200 to DLP9500UV Interface Overview
      5. 8.3.5 Measurement Conditions
    4. 8.4 Device Functional Modes
      1. 8.4.1 Single Block Mode
      2. 8.4.2 Dual Block Mode
      3. 8.4.3 Quad Block Mode
      4. 8.4.4 Global Block Mode
    5. 8.5 Window Characteristics and Optics
      1. 8.5.1 Optical Interface and System Image Quality
      2. 8.5.2 Numerical Aperture and Stray Light Control
      3. 8.5.3 Pupil Match
      4. 8.5.4 Illumination Overfill
    6. 8.6 Micromirror Array Temperature Calculation
      1. 8.6.1 Thermal Test Points
      2. 8.6.2 Micromirror Array Temperature Calculation - Lumens Based
      3. 8.6.3 Micromirror Array Temperature Calculation - Power Density Based
      4. 8.6.4 59
    7. 8.7 Micromirror Landed-On and Landed-Off Duty Cycle
      1. 8.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 8.7.2 Landed Duty Cycle and Useful Life of the DMD
      3. 8.7.3 Landed Duty Cycle and Operational DMD Temperature
      4. 8.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 DMD Reflectivity Characteristics
        1. 9.1.1.1 Design Considerations Influencing DMD Reflectivity
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
        1. 9.2.1.1 Device Description
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 Power-Up Sequence (Handled by the DLPC410)
    2. 10.2 DMD Power-Up and Power-Down Procedures
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Impedance Requirements
      2. 11.1.2 PCB Signal Routing
      3. 11.1.3 Fiducials
      4. 11.1.4 PCB Layout Guidelines
        1. 11.1.4.1 DMD Interface
          1. 11.1.4.1.1 Trace Length Matching
        2. 11.1.4.2 DLP9500UV Decoupling
          1. 11.1.4.2.1 Decoupling Capacitors
        3. 11.1.4.3 VCC and VCC2
        4. 11.1.4.4 DMD Layout
        5. 11.1.4.5 DLPA200
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
      2. 12.1.2 Device Marking
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Related Links
    4. 12.4 サポート・リソース
    5. 12.5 Trademarks
    6. 12.6 静電気放電に関する注意事項
    7. 12.7 用語集
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

8.6.3 Micromirror Array Temperature Calculation - Power Density Based

Micromirror array temperature cannot be measured directly; therefore, it must be computed analytically from:

  • the measurement points (Figure 8-11)
  • the package thermal resistance
  • the electrical power
  • the illumination heat load

The relationship between array temperature and the reference ceramic temperature (thermal test point TP1 in Figure 8-11) is provided by the following equations:

where

  • TARRAY = computed array temperature (°C)
  • TCERAMIC = measured ceramic temperature (°C) (TP1 location)
  • RARRAY-TO-CERAMIC = thermal resistance of DMD package (specified in Section 7.5) from array to ceramic TP1 (°C/W)
  • QARRAY = total power (electrical + absorbed) on the array (Watts)
  • QELECTRICAL = nominal electrical power (Watts)
  • QINCIDENT = total incident optical power on DMD (Watts)

The electrical power dissipation of the DMD is variable and depends on the voltages, data rates, and operating frequencies. A nominal electrical power dissipation to use when calculating array temperature is 4.4 watts. The absorbed power from the illumination source is variable and depends on the operating state of the micromirrors and the intensity of the light source. The equations shown above are valid for each DMD chip in a system. It assumes an illumination distribution of 83.7% on the active array and 16.3% on the array border.