JAJSLB2D november 2014 – april 2023 DLP9500UV
PRODUCTION DATA
TI assumes no responsibility for end-equipment reflectivity performance. Achieving the desired end-equipment reflectivity performance involves making trade-offs between numerous component and system design parameters. Typical DMD reflectivity characteristics over UV exposure times are represented in Figure 9-1.
2.3 W/cm2, 363 to 400 nm, 25°C |
DMD reflectivity includes micromirror surface reflectivity and window transmission. The DMD was characterized for DMD reflectivity using a broadband light source (200-W metal-halide lamp). Data is based off of a 2.3 W/cm2 UV exposure at the DMD surface (365 nm peak output) using a 363 nm high pass filter between the light source and the DMD. (Contact your local Texas Instruments representative for additional information about power density measurements and UV filter details.)