The register configuration for the ADS1282-SP used the default settings with the exception of the MUX Select bits in the Configuration 1 Register, and the Digital Filter Select bits in the Configuration 0 Register. For SEL testing, the MUX Select was configured to the default value of AINP1 and AINN1. For SET testing, the MUX Select was configured for the default value of AINP1 and AINN1, AINP2 and AINN2, and Internal Short via 400Ω as required [6].

For SEL testing, the Digital Filter Select was configured for the default value of Sinc + LPF Filter Blocks. For SET testing, the Digital Filter Select was configured for the default value of Sinc + LPF Filter Blocks and On-Chip Bypassed, Modulator Output Mode, as required [6].

Since SEE testing is performed in a noisy environment, a number of bits of conversion data were masked until no error events occurred without irradiating the ADS1282-SP [6]. The signals monitored during the test were routed to the control room (approximately 20-feet away) using shielded coaxial cable. Table 5-2 lists the ions, angles, and LETs used to characterize the SEE response of the ADS1282-SP devices.