SBAA222A October   2017  – April 2025 ADS1282-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 SEE Mechanisms
  6. 3 Test Device and Evaluation Board
  7. 4 Irradiation Facility and Setup
    1. 4.1 Depth, Range, and LETeff Calculation
  8. 5 Test Setup and Procedures
    1. 5.1 SEE Testing Block Diagram
    2. 5.2 Test Parameters
    3. 5.3 Test Conditions
  9. 6 SET Test Results
  10. 7 SEL Test Results
  11. 8 Conclusions
  12. 9 Acknowledgment
  13. 10References
  14. 11Revision History

Abstract

The single-event effects behavior of the ADS1282-SP, a high dynamic range analog-to-digital converter (ADC), is presented. No latch-up events were detected up to a linear energy transfer (LET) of 50.5MeV × cm2/ mg at 85°C and 125°C, nor were any latch-up events detected up to an LET of 60.4MeV × cm2/ mg at 85°C. The device exhibits a single event transient (SET) saturated cross-section of 3.7 × 10–4 cm2. For register upsets, the device exhibited a saturated cross-section of 1.3 × 10–5 cm2.