SLAAED9 November   2023 TAA5412-Q1 , TAC5311-Q1 , TAC5312-Q1 , TAC5411-Q1 , TAC5412-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. Introduction
  5. Diagnostic Monitoring Architecture
  6. Monitored Faults
    1. 3.1 Microphone Faults
      1. 3.1.1 Inputs Shorted to Ground
      2. 3.1.2 Inputs Shorted to MICBIAS
      3. 3.1.3 Input Open Circuit
      4. 3.1.4 Input Pins Shorted Together
      5. 3.1.5 Input Overvoltage Detection
      6. 3.1.6 Inputs Shorted to VBAT
    2. 3.2 Line Out Faults
      1. 3.2.1 Output Overcurrent
      2. 3.2.2 Virtual Ground
    3. 3.3 Other Faults
      1. 3.3.1 MICBIAS Overvoltage
        1. 3.3.1.1 DIAG_CFG11 Register (page = 0x01, address = 0x51) [Reset = 0x40]
      2. 3.3.2 MICBIAS Overcurrent
      3. 3.3.3 MICBIAS Load Current
        1. 3.3.3.1 DIAG_CFG6 Register (page = 0x01, address = 0x4C) [Reset = 0xA2]
        2. 3.3.3.2 DIAG_CFG7 Register
      4. 3.3.4 Overtemperature Fault
      5. 3.3.5 Supply Back Pumping
  7. Enabling Diagnostics and Programming Thresholds
    1. 4.1 DIAG_CFG0 Register (page = 0x01, Address = 0x46) [Reset = 0x00]
    2. 4.2 DIAG_CFG1 Register (page = 0x01, Address = 0x47) [Reset = 0x37]
    3. 4.3 DIAG_CFG2 Register (page = 0x01, Address = 0x48) [Reset = 0x87]
  8. Fault Diagnostic Setup Procedure
  9. Fault Reporting
    1. 6.1 Live Registers
      1. 6.1.1 CHx_LIVE Register (page = 0x01, address = 0x3D) [Reset = 0b]
      2. 6.1.2 CH1_LIVE Register (page = 0x01, address = 0x3E) [Reset = 0h]
      3. 6.1.3 INT_LIVE0 Register (page = 0x01, address = 0x3C) [Reset = 00]
      4. 6.1.4 INT_LIVE1 Register (page = 0x00, address = 0x42) [reset = 0x00]
      5. 6.1.5 INT_LIVE2 Register (page = 0x00, address = 0x43) [reset = 0x00]
    2. 6.2 Latched Registers
      1. 6.2.1 Clearing Latched Registers
    3. 6.3 Fault Filtering and Response Time
      1. 6.3.1 Debounce
      2. 6.3.2 Scan Rate
        1. 6.3.2.1 DIAG_CFG4 Register (page = 0x01, address = 0x4A) [reset = 0xB8]
      3. 6.3.3 Moving Average
        1. 6.3.3.1 DIAG_CFG5 Register (page = 0x01, address = 0x4B) [reset = 0h]
  10. Responding to a Fault
    1. 7.1 INT_CFG Register (page = 0x00, address = 0x42) [reset = 0b]
      1. 7.1.1 DIAG_CFG10 Register (page = 0x01, address = 0x50) [Reset = 0x88]
    2. 7.2 Manual Recovery Sequence
    3. 7.3 Recommended Fault Register Read Sequence
  11. Using PurePath Console
    1. 8.1 Advanced Tab
    2. 8.2 Diagnostics Walk-through
      1. 8.2.1 Diagnostics Configuration
      2. 8.2.2 Debounce Configuration
      3. 8.2.3 Latched Fault Status
  12. Diagnostic Monitoring Registers
    1. 9.1 Voltage Measurements
    2. 9.2 MICBIAS Load Current
    3. 9.3 Internal Die Temperature
  13. 10Summary
  14. 11References

Recommended Fault Register Read Sequence

Once a fault has occurred and an interrupt is generated, the diagnostic registers can be used to determine present faults. For most applications, the latched registers is used to identify faults since these register can be transient and are no longer reflected in the live registers. When reading latched registers, reading each of the latched fault registers is recommended to verify that all errors are detected and that the latches are reset accordingly. The exact sequence of register reads occurring depends on the application and mask settings. The following is provided as a default recommended sequence to avoid missing faults.

  1. Read INT_LTCH0 register to determine if any clock, PLL, overtemperature, or overcurrent faults have occurred.
  2. Read the CHx_LTCH register to determine which input channels, if any, experienced faults.
  3. If a channel has experienced a fault, read the INT_LTCH1 register first to determine if an overvoltage fault has occurred.
  4. Read the associated IN_CH_LTCH register for the channels identified in step 1 to determine which other faults have occurred.

Since reading the overvoltage register in INT_LTCH1 clears the short to VBAT_IN bits in the IN_CHx_LTCH registers, not detecting a short to VBAT_IN is possible if the short is a transient short. Detecting an overvoltage is preferred since any short to VBAT_IN also triggers an overvoltage fault as long as VBAT_IN > MICBIAS (as is the case in most applications). Furthermore, a short to VBAT_IN is less likely to be transient in nature, and is still readable in the respective latched or live register depending on the LTCH_CLR_ON_READ setting.