SPRUJ28F November 2021 – August 2025 AM68 , AM68A , TDA4AL-Q1 , TDA4VE-Q1 , TDA4VL-Q1
Built-in Self-test (BIST) is a feature that allows self-testing of the memory areas and logic circuitry in an Integrated Circuit (IC) without any external test equipment. In an embedded system, these tests are typically used during boot time or shutdown of the system to check the health of an SoC.
LBIST is used to test the logic circuitry in an SoC associated with the CPU cores. There are multiple LBIST instances in the SoC, and each has a different processor core associated with it. There are LBIST tests that can be software-initiated, as well as LBIST status of HW Power on self-tests (POST).
For a list of LBIST modules, see Device Configuration -> Module Integration -> LBIST.