SLPS755B October 2023 – October 2025 RES11A-Q1
PRODUCTION DATA
The resistors of the RES11A-Q1 are described by the following equations:
RINnom and RGnom are the nominal values of each resistor. The parameter tabs is an error term that describes the absolute tolerance of the RES11A-Q1 resistor in question, such that |tabs| ≤ 12%. For example, a nominally 1kΩ resistor with tabs = 10% actually measures 1.1kΩ. This error is analogous to the specified absolute tolerance of most single-element resistors, or the end-to-end tolerance of more specialized resistor dividers.
The absolute tolerance is dominated by the variation in the SiCr resistivity, tSiCr. The four resistors of a given RES11A-Q1 are interdigitated and come from the same area of the wafer; therefore, tSiCr is effectively the same for each of the four resistors, although tSiCr varies on a part-to-part basis.
The following examples show that when each divider is considered in ratiometric terms, the tSiCr error terms drop out. Parameter tRx is an residual error term that describes the remaining effective tolerance of each resistor of the given RES11A-Q1 device after accounting for the universal tSiCr.
The individual values of tRG1, tRG2, tRIN1, and tRIN2 describe the tolerance of each individual resistor, but are not independent variables in a Gaussian sense. Rather, the matching of these values to each other (by design) is used to achieve highly stable ratiometric relationships between the resistors, giving an effective ratio with an extremely low error.
The limits of tDx for the RES11A-Q1 are enforced by precise parametric testing in production, with Kelvin connections used to better reject potential sources of error. Because the resulting tD1 and tD2 values are more randomized error terms, tD1 and tD2 can be treated as independent Gaussian distributions, making these variables much more useful for error analyses. Single-element resistors do not have an equivalent to tDx, because no part-to-part matching is considered other than the gradeout limit. In other divider data sheets, the equivalent of tDx is often called ratio tolerance.
Because any devices that do not meet these criteria are screened out at final test, these equations can technically be used with Equation 14 to prove additional relationships (such as effective maximum limits) between the values of tRx for a given device. This exercise ultimately gives overly conservative results, however. For more realistic statistical analysis with root-sum-of-squares methods, the Arbitrary Matching section of the Electrical Characteristics table provides measured standard deviations for some additional resistor-to-resistor relationships. See Section 8.1.3.2 for a practical example.