SLPS755B October   2023  – October 2025 RES11A-Q1

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Typical Characteristics
  7. Parameter Measurement Information
    1. 6.1 DC Measurement Configurations
    2. 6.2 AC Measurement Configurations
    3. 6.3 Error Notation and Units
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Ratiometric Matching for Low Gain Error
        1. 7.3.1.1 Absolute and Ratiometric Tolerances
      2. 7.3.2 Ratiometric Drift
        1. 7.3.2.1 Long-Term Stability
      3. 7.3.3 Predictable Voltage Coefficient
      4. 7.3.4 Ultra-Low Noise
    4. 7.4 Device Functional Modes
      1. 7.4.1 Per-Resistor Limitations
  9. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Amplifier Feedback Circuit
        1. 8.1.1.1 Amplifier Feedback Circuit Example
      2. 8.1.2 Voltage Divider Circuit
        1. 8.1.2.1 Voltage Divider Circuit Example
        2. 8.1.2.2 Voltage-Divider Circuit Drift
      3. 8.1.3 Discrete Difference Amplifier
        1. 8.1.3.1 Difference-Amplifier Common-Mode Rejection Analysis
        2. 8.1.3.2 Difference-Amplifier Gain Error Analysis
      4. 8.1.4 Discrete Instrumentation Amplifiers
      5. 8.1.5 Fully Differential Amplifier
      6. 8.1.6 Unconventional Circuits
        1. 8.1.6.1 Single-Channel Voltage Divider
        2. 8.1.6.2 Single-Channel Amplifier Gain
          1. 8.1.6.2.1 Gain Scaling the RES60A-Q1 With the RES11A-Q1
      7. 8.1.7 Unconventional Instrumentation Amplifiers
    2. 8.2 Typical Application
      1. 8.2.1 Common-Mode Shifting Input Stage
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Examples
  10. Device and Documentation Support
    1. 9.1 Device Support
      1. 9.1.1 Development Support
        1. 9.1.1.1 PSpice® for TI
        2. 9.1.1.2 TINA-TI™ Simulation Software (Free Download)
        3. 9.1.1.3 TI Reference Designs
        4. 9.1.1.4 Analog Filter Designer
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Absolute and Ratiometric Tolerances

The resistors of the RES11A-Q1 are described by the following equations:

Equation 10. R IN1 = R INnom × 1+ t absRIN1 = R INnom × 1+ t RIN1 × 1+ t SiCr
Equation 11. R IN2 = R INnom × 1+ t absRIN2 = R INnom × 1+ t RIN2 × 1+ t SiCr
Equation 12. R G1 = R Gnom × 1+ t absRG1 = R Gnom × 1+ t RG1 × 1+ t SiCr
Equation 13. R G2 = R Gnom × 1+ t absRG2 = R Gnom × 1+ t RG2 × 1+ t SiCr

RINnom and RGnom are the nominal values of each resistor. The parameter tabs is an error term that describes the absolute tolerance of the RES11A-Q1 resistor in question, such that |tabs| ≤ 12%. For example, a nominally 1kΩ resistor with tabs = 10% actually measures 1.1kΩ. This error is analogous to the specified absolute tolerance of most single-element resistors, or the end-to-end tolerance of more specialized resistor dividers.

Note: The RES11A-Q1 is not a laser-trimmed device. Each ratio of the RES11A-Q1 features a unique die specifically optimized for that ratio, providing the precise matching and consistent thermal characteristics necessary to achieve extremely low drift.

The absolute tolerance is dominated by the variation in the SiCr resistivity, tSiCr. The four resistors of a given RES11A-Q1 are interdigitated and come from the same area of the wafer; therefore, tSiCr is effectively the same for each of the four resistors, although tSiCr varies on a part-to-part basis.

The following examples show that when each divider is considered in ratiometric terms, the tSiCr error terms drop out. Parameter tRx is an residual error term that describes the remaining effective tolerance of each resistor of the given RES11A-Q1 device after accounting for the universal tSiCr.

Equation 14. R Gx R INx = R Gnom × 1+ t RGx × 1+ t SiCr R INnom × 1+ t RINx × 1+ t SiCr = R Gnom × 1+ t RGx R INnom × 1+ t RINx = G nom × 1+ t RGx 1+ t RINx = G x
Equation 15. R INx R INx + R Gx = R INnom × 1+ t RINx × 1+ t SiCr R INnom × 1+ t RINx × 1+ t SiCr + R Gnom × 1+ t RGx × 1+ t SiCr = R INnom × 1+ t RINx R INnom × 1+ t RINx + R Gnom × 1+ t RGx

The individual values of tRG1, tRG2, tRIN1, and tRIN2 describe the tolerance of each individual resistor, but are not independent variables in a Gaussian sense. Rather, the matching of these values to each other (by design) is used to achieve highly stable ratiometric relationships between the resistors, giving an effective ratio with an extremely low error.

The limits of tDx for the RES11A-Q1 are enforced by precise parametric testing in production, with Kelvin connections used to better reject potential sources of error. Because the resulting tD1 and tD2 values are more randomized error terms, tD1 and tD2 can be treated as independent Gaussian distributions, making these variables much more useful for error analyses. Single-element resistors do not have an equivalent to tDx, because no part-to-part matching is considered other than the gradeout limit. In other divider data sheets, the equivalent of tDx is often called ratio tolerance.

Because any devices that do not meet these criteria are screened out at final test, these equations can technically be used with Equation 14 to prove additional relationships (such as effective maximum limits) between the values of tRx for a given device. This exercise ultimately gives overly conservative results, however. For more realistic statistical analysis with root-sum-of-squares methods, the Arbitrary Matching section of the Electrical Characteristics table provides measured standard deviations for some additional resistor-to-resistor relationships. See Section 8.1.3.2 for a practical example.