SLUUBT4B June 2018 – June 2025 BQ40Z80
To prevent the loss of board functionality during the fuse-blowing test, the actual chemical fuse is not provided on the EVM. FET Q9 drives the FUSE test point low if a fuse-blow condition occurs. FUSE is attached to an open drain FET, so a pull-up resistor is required to check whether the FUSE pulls low. A FUSEPIN test point is attached to the gate of Q9; so, monitoring FUSEPIN can be used to test this condition without adding a pull-up resistor. Fuse placement on the application board is shown in the bq40z80 data sheet. A chemical fuse can also be soldered to the EVM for in-system testing. When using the chemical fuse, remove the shorting resistor R1 from the board.