SLVAE32B August   2018  – December 2023 TPS7H2201-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Device Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Depth, Range, and LETEFF Calculation
  8. 5 Irradiation Facility and Setup
  9. 6 Test Setup and Procedures
  10. 7 Single-Event-Latchup (SEL), Single-Event-Burnout (SEB), and Single-Event-Gate-Rupture (SEGR)
    1. 7.1 Single-Event-Latchup (SEL)
    2. 7.2 Single-Event-Burnout (SEB) and Single-Event-Gate-Rupture (SEGR)
  11. 8 Single Event Transient (SET)
  12. 9 Total Ionizing Dose From SEE Experiments
  13. 10Orbital Environment Estimations
  14. 11Confidence Interval Calculations
    1. 11.1 Rate Orbit Calculation
  15. 12Summary
  16. 13References
  17. 14Revision History

3 Test Device and Evaluation Board Information

The TPS7H2201-SP is packaged in a 16-pin thermally-enhanced dual ceramic flat pack package (HKH) as shown in Figure 3-1. The TPS7H2201EVM-CVAL evaluation board was used to evaluate the performance and characteristics of the TPS7H2201-SP under heavy-ions. Figure 3-2 shows the top and bottom views of the evaluation board used for the radiation testing. Figure 3-3 shows the board schematics. See the TPS7H2201-SP Single Evaluation Module for more information about the evaluation board.

GUID-4E3C0CB4-2DB2-4CFA-BA3E-F5E5C4BBD000-low.gif

The package lid was removed to reveal the die face for all heavy ions testing

Figure 3-1 Photograph of Delidded TPS7H2201-SP (Left) and Pin Out Diagram (Right)
GUID-2B59EF61-CC1A-47E4-8BF3-023B4EB139EB-low.gifFigure 3-2 TPS7H2201-SP Board Top View (Left) and Bottom-View (Right)
GUID-0D24CBD7-CA6D-4F2E-A89E-C02B104F1518-low.gif

R2, R3, C14, and C16 are populated components on the TPS7H2201EVM-CVAL, however, the components were removed and all boards used for the characterization discussed in this report had the switch closed during most of the SEE characterization.

Figure 3-3 Schematics of the TPS7H2201EVM-CVAL Used for the Heavy-ion Testing