SLVK199 August   2025 TPS7H3024-SP

 

  1.   1
  2.   TPS7H3024-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects (SEE)
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. LETEFF and Range Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. Single-Event Transients (SET)
  12. Event Rate Calculations
  13. 10Summary
  14.   A References

Introduction

The TPS7H3024-SP is an integrated 3V to 14V, four channel radiation-hardness assured power-supply supervisor with watchdog. Features for the device include:

  • A 599.7mV ± 1% threshold voltage
  • 24µA ± 3% hysteresis current
  • Global programmable timer through a single resistor
  • Positive edge detection watchdog timer to monitor an external processor
  • Faults mitigated and controlled by SR_UVLO

The device is offered in a 22-pin ceramic package. General device information and test conditions are listed in Table 1-1. For more detailed technical specifications, user-guides, and application notes please go to TPS7H3024-SP product page.

Table 1-1 Overview Information
DESCRIPTION(1)DEVICE INFORMATION
TI Part NumberTPS7H3024-SP
Orderable Number5962R2420601VXC
Device Function4-channel supervisor with watchdog
TechnologyLBC7 (Linear BiCMOS 7)
Exposure FacilityRadiation Effects Facility, Cyclotron Institute, Texas A&M University (15MeV/nucleon)

and Facility for Rare Istotope Beams, K500 Cyclotron (KSEE), Michigan State University (19.5MeV/nucleon)

Heavy Ion Fluence per Run1.00 × 107 ions/cm2
Irradiation Temperature25°C (for SEB/SEGR testing), 25°C (for SET testing), and 125°C (for SEL testing)
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