SLVK199 August   2025 TPS7H3024-SP

 

  1.   1
  2.   TPS7H3024-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

6 Test Setup and Procedures

There were five input supplies used to provide power to the TPS7H3024-SP. The voltage values and the model of the used equipment per the SEE test type is presented in Table 6-1.

With SR_UVLO forced to 1V the device was in the enabled state with all RESETS high and in the disabled state with all RESETS low when forced to 0V.

Table 6-1 Details of Power Supplies Used for the Heavy-Ion Test Campaign of the TPS7H3024-SP
VOLTAGE NAMEVOLTAGE (V)SEE TEST TYPEPOWER SUPPLY MODEL

VIN

14

SEL, SEB/SEGR

N6766A

VPULL_UP1

7

PXIe-4139

VPULL_UP2

7

SR_UVLO

0, 1

MODE

0, 1

WDOGIN

5 & fSW=500kHz

PXIe-5433

VIN

3.3

SET

N6766A

VPULL_UP1

1.8

PXIe-4139

VPULL_UP2

1.8

SR_UVLO

0, 1

MODE0, 1
WDOGIN5 & fSW=500kHzPXIe-5433

As discussed in Section 3 the TPS7H3024-SP was tested (or evaluated) under heavy-ions using two unique configurations.

  1. During the DSEE testing four power supplies were used to drive the external resistive divider connected to the VOUTx inputs. This voltage was forced so that the SENSEx inputs were ± 400mV of the nominal threshold voltage of 599mV

  2. During the SET testing four power supplies were used to drive the external resistive divider connected to the VOUTx inputs. This voltage was forced so that the SENSEx inputs were ± 20mV of the nominal threshold voltage of 599mV

Transients were monitored on RESET1, RESET4, WDO and PWRGD. The equipment used and the trigger details are summarized in Table 6-2. The device was tested for transients in both the on and off state.

Table 6-2 Summary of Oscilloscope and Conditions Used for the SEE Test Campaign of the TPS7H3014-SP

SIGNAL NAME

EQUIPMENT USED TO MONITOR SIGNAL

TRIGGER TYPE

TRIGGER VALUE

WHEN SIGNAL WAS HIGH (%)

TRIGGER VALUE

WHEN SIGNAL WAS LOW (V)

RESET1

PXIe-5172

Falling-edge/Rising-edge

–20% (from nominal)

0.66

RESET4

PXIe-5172

Falling-edge/Rising-edge–20% (from nominal)

0.66

PWRGD

PXIe-5172Falling-edge/Rising-edge–20% (from nominal)

0.66

WDO

PXIe-5172

Falling-edge/Rising-edge

–20% (from nominal)

0.66

Figure 6-1 shows a block diagram of the setup used for SEE testing of the TPS7H3024-SP.

All boards used for SEE testing were fully checked for functionality. Dry runs were also performed to ensure that the test system was stable under all bias and load conditions prior to being taken to the test facilities. During the heavy-ion testing, the LabVIEW control program powered up the TPS7H3024-SP device and set the external sourcing and monitoring functions of the external equipment. After functionality and stability was confirmed, the beam shutter was opened to expose the device to the heavy-ion beam. The shutter remained open until the target fluence was achieved (determined by external detectors and counters). During irradiation, the NI scope cards continuously monitored the signals. When the output exceeded the pre-defined 20% edge trigger, a data capture was initiated. No sudden increases in current were observed (outside of normal fluctuations) on any of the test runs and indicated that no SEL or SEB/SEGR events occurred during any of the tests. Neither, a single transient was capture by the oscilloscope measuring the outputs indicting the device is SET-free.

Block Diagram of the SEE Test Setup for the TPS7H3024-SPFigure 6-1 Block Diagram of the SEE Test Setup for the TPS7H3024-SP