10 Revision History
Changes from Revision B (June 2024) to Revision C (May 2025)
- Updated maximum IOUT in Recommended Operating Conditions from 2mA to 4.5mAGo
- Corrected top to bottomGo
- Changed Sensitivity Drift format in Magnetic Characteristics for A1 tableGo
- Changed Sensitivity Mismatch Drift format in Magnetic Characteristics for A1 tableGo
- Changed Sensitivity Drift format in Magnetic Characteristics for A2 tableGo
- Changed Sensitivity Mismatch Drift format in Magnetic Characteristics for A2 tableGo
- Added sensing element location from center of dieGo
- Added INT_POL_EN as a bit field needed to invert INT polarity Go
- Added text to latched interrupt through INT behavior Go
- Added text to describe wake on change behavior when
used in wake and sleep modeGo
- Added text to clarify wake on change with magnetic
axis measurementsGo
- Added table to summarize relevant wake on change
mode settingsGo
- Added extra note that TMAG3001 supports General Call I2C Address
to the I2C Address section.Go
- Added INT behavior while transitioning from sleep to standby mode Go
- Added text to describe device behavior when an I2C read
is executed after an interruptGo
- Added Data from Register N +2 and Data from Register N+3
information to the Standard I2C Read With CRC Enabled
imageGo
- Changed NA to A to align with the ACK from Controller text in
I2C Read Command for 16-Bit Data
Go
- Changed NA to A to align with the ACK from Controller text in
I2C Read Command for 8-Bit Data
Go
- Added note on CRC behavior with multiple device on the I2C busGo
- Changed the LSB size for each magnetic range for magnetic data
calculationGo
- Changed table title from 1-bit to 8-bitGo
- Added text to the THR_HYST[2:0] bit descriptions Go
- Added text to the Angle_HYS[1:0] bit descriptions Go
- Added text to the Threshold1[7:0], Threshold2[7:0], Threshold3[7:0], Gain_X_THR_HI[7:0], Offset1_Y_THR_HI[7:0], and Offset2_Z_THR_HI[7:0] bitfield descriptions Go
- Added text to WOC_SEL[1:0] bitfield description Go
- Changed I2C_Address[6:0] bit field descriptionGo
- Added text to describe magnetic thresholdsGo
- Added text to describe unipolar switch mode thresholdsGo
Changes from Revision A (March 2023) to Revision B (June 2024)
- Changed TMAG3001A1 device status from Advanced Information to
Production DataGo
- Changed data sheet status from Production Mixed to Production
DataGo
- Updated ESD Ratings formattingGo
- Change maximum input capacitance from: 10pF to 7.5pFGo
- Added maximum values for the sensitivity linearity error parameter to the Magnetic Characteristics for A2 tableGo
- Added sensitivity drift linearity error parameter to the Magnetic Characteristics for A2 tableGo
- Added sensitivity mismatch drift linearity parameter to the Magnetic Characteristics for A2 tableGo
- Added offset drift linearity error parameter to the Magnetic Characteristics for A2 tableGo
- Changed minimum hold time after repeated START condition from: 0µs to: 0.1µsGo
- Changed minimum data hold time for fast mode from: 0ns to:15nsGo
- Changed minimum data hold time for fast mode plus from: 0ns to:15nsGo
- Added minimum and maximum values for Power-Up Timing parametersGo
- Changed typical time to go to standby mode from sleep mode from: 70µs to: 62µsGo
Changes from Revision * (November 2023) to Revision A (March 2024)
- Changed TMAG3001A2 device status from Advanced Information to
Production DataGo
- Changed data sheet status from Advanced Information to Production
MixedGo