SNOSDI8B May 2024 – February 2026 LMG2650
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| LOW-SIDE GAN POWER FET | ||||||
| td(on)(Idrain)(ls) | Drain current turn-on delay time | From VINL > VINL,IT+ to ID(ls) > 50mA, VBUS = 400V, ISW = 2.65A, at following low-side slew rate settings, see Section 6.1 | ||||
| slew rate setting 0 (slowest) | 48 | 165 | ns | |||
| slew rate setting 1 | 48 | 100 | ||||
| slew rate setting 2 | 43 | 80 | ||||
| slew rate setting 3 (fastest) | 34 | 65 | ||||
| td(on)(ls) | Turn-on delay time | From VINL > VINL,IT+ to VDS(ls) < 390V, VBUS = 400V, ISW = 2.65A, at following low-side slew rate settings, see Section 6.1 | ||||
| slew rate setting 0 (slowest) | 89 | 255 | ns | |||
| slew rate setting 1 | 70 | 137 | ||||
| slew rate setting 2 | 59 | 100 | ||||
| slew rate setting 3 (fastest) | 41 | 75 | ||||
| tr(on)(ls) | Turn-on rise time | From VDS(ls) < 320V to VDS(ls) < 80V, VBUS = 400V, ISW = 2.65A, at following low-side slew rate settings, see Section 6.1 | ||||
| slew rate setting 0 (slowest) | 131 | 180 | ns | |||
| slew rate setting 1 | 51 | 65 | ||||
| slew rate setting 2 | 11 | 19 | ||||
| slew rate setting 3 (fastest) | 5 | 10 | ||||
| td(off)(ls) | Turn-off delay time | From VINL < VINL,IT– to VDS(ls) > 80V, VBUS = 400V, ISW = 2.65A, (independent of slew rate setting), see Section 6.1 | 45 | 65 | ns | |
| tf(off)(ls) | Turn-off fall time | From VDS(ls) > 80V to VDS(ls) > 320V, VBUS = 400V, ISW = 2.65A, (independent of slew rate setting), see Section 6.1 | 20 | ns | ||
| Turn-on slew rate | From VDS(ls) < 320V to VDS(ls) < 80V, TJ = 25℃, VBUS = 400V, ISW = 2.65A, at following low-side slew rate settings, see Section 6.1 | |||||
| slew rate setting 0 (slowest) | 2 | V/ns | ||||
| slew rate setting 1 | 5 | |||||
| slew rate setting 2 | 23 | |||||
| slew rate setting 3 (fastest) | 50 | |||||
| HIGH-SIDE GAN POWER FET | ||||||
| td(on)(Idrain)(hs,INH) | Drain current turn-on delay time | From VINH > VINH,IT+ to ID(hs) > 50mA, VBUS = 400V, ISW = –2.65A, at following high-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 51 | 160 | ns | |||
| slew rate setting 1 | 51 | 95 | ||||
| slew rate setting 2 | 45 | 78 | ||||
| slew rate setting 3 (fastest) | 34 | 62 | ||||
| td(on)(Idrain)(hs,GDH) | Drain current turn-on delay time | From VGDH > VGDH,IT+ to ID(hs) > 50mA, VBUS = 400V, ISW = –2.65A, at following high-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 46 | 150 | ns | |||
| slew rate setting 1 | 46 | 90 | ||||
| slew rate setting 2 | 41 | 75 | ||||
| slew rate setting 3 (fastest) | 32 | 63 | ||||
| td(on)(hs,INH) | Turn-on delay time | From VINH > VINH,IT+ to VDS(hs) < 390V, VBUS = 400V, ISW = –2.65A, at following high-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 75 | 250 | ns | |||
| slew rate setting 1 | 67 | 133 | ||||
| slew rate setting 2 | 56 | 97 | ||||
| slew rate setting 3 (fastest) | 39 | 73 | ||||
| td(on)(hs,GDH) | Turn-on delay time | From VGDH > VGDH,IT+ to VDS(hs) < 390V, VBUS = 400V, ISW = –2.65A, at following high-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 110 | 233 | ns | |||
| slew rate setting 1 | 83 | 126 | ||||
| slew rate setting 2 | 68 | 96 | ||||
| slew rate setting 3 (fastest) | 46 | 74 | ||||
| tr(on)(hs) | Turn-on rise time | From VDS(hs) < 320V to VDS(hs) < 80V, VBUS = 400V, ISW = –2.65A, at following high-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 133 | 178 | ns | |||
| slew rate setting 1 | 50 | 65 | ||||
| slew rate setting 2 | 10 | 18.5 | ||||
| slew rate setting 3 (fastest) | 4 | 10 | ||||
| td(off)(hs,INH) | Turn-off delay time | From VINH < VINH,IT– to VDS(hs) > 80V, VBUS = 400V, ISW = –2.65A, (independent of slew rate setting), see GaN Power FET Switching Parameters | 40 | 55 | ns | |
| td(off)(hs,GDH) | Turn-off delay time | From VGDH < VGDH,IT– to VDS(hs) > 80V, VBUS = 400V, ISW = –2.65A, (independent of slew rate setting), see GaN Power FET Switching Parameters | 40 | 65 | ns | |
| tf(off)(hs) | Turn-off fall time | From VDS(hs) > 80V to VDS(hs) > 320V, VBUS = 400V, ISW = –2.65A, (independent of slew rate setting), see GaN Power FET Switching Parameters | 20 | ns | ||
| Turn-on slew rate | From VDS(hs) < 320V to VDS(hs) < 80V, TJ = 25℃, VBUS = 400V, ISW = –2.65A, at following high-side slew rate settings, see GaN Power FET Switching Parameters | |||||
| slew rate setting 0 (slowest) | 2 | V/ns | ||||
| slew rate setting 1 | 5 | |||||
| slew rate setting 2 | 23 | |||||
| slew rate setting 3 (fastest) | 50 | |||||
| LOW-SIDE OVERCURRENT PROTECTION | ||||||
| t(OC)(ls) | Overcurrent fault response time, FET on before overcurrent | From ID(ls) > IT(OC)(ls) to ID(ls) < 0.5 × IT(OC)(ls), ID(ls) di/dt = 125A/µs | 75 | 120 | ns | |
| t(OC)(en)(ls) | Overcurrent fault response time, FET enabled into a short | VDS(ls) = 100V; From ID(ls) > IT(OC)(ls) to ID(ls) < 0.5 × IT(OC)(ls), at following slew rate setting | ||||
| slew rate setting 0 (slowest) | 390 | 470 | ns | |||
| slew rate setting 1 | 205 | 235 | ns | |||
| slew rate setting 2 | 175 | 205 | ns | |||
| slew rate setting 3 (fastest) | 125 | 172 | ns | |||
| HIGH-SIDE OVERCURRENT PROTECTION | ||||||
| t(OC)(hs) | Overcurrent fault response time, FET on before overcurrent | From ID(ls) > IT(OC)(ls) to ID(ls) < 0.5 × IT(OC)(ls), ID(hs) di/dt = 125A/µs | 65 | 125 |
ns | |
| t(OC)(en)(hs) | Overcurrent fault response time, FET enabled into a short | VDS(hs) = 100V; From ID(hs) > IT(OC)(hs) to ID(hs) < 0.5 × IT(OC)(hs), at following slew rate setting | ||||
| slew rate setting 0 (slowest) | 330 | 375 | ns | |||
| slew rate setting 1 | 175 | 190 | ns | |||
| slew rate setting 2 | 145 | 170 | ns | |||
| slew rate setting 3 (fastest) | 100 | 150 | ns | |||
| CS | ||||||
| tr | Rise time | From ICS(src) > 0.2 × ICS(src)(final) to ICS(src) > 0.9 × ICS(src)(final), 0V ≤ VCS ≤ 2V, Low-side enabled into a 2.65A load | 30 | ns | ||
| EN, INL, INH | ||||||
| EN wake-up time | From VEN > VIT+ to ID(ls) > 10mA, VINL = 5V | 1.5 | µs | |||
| Minimum INL L-H-L pulse that changes the low-side output | VINL 0V to 5V to 0V at 5V/ns, VDS(ls) has to fall to 200 V, VBUS = 400V, ISW = 2.5A, at below low-side slew rate settings | |||||
| slew rate setting 0 (slowest) | 190 | ns | ||||
| slew rate setting 1 | 100 | |||||
| slew rate setting 2 | 55 | |||||
| slew rate setting 3 (fastest) | 25 | |||||
| Minimum INH L-H-L pulse that changes the high-side output | VINH 0V to 5V to 0V at 5V/ns, VDS(hs) has to fall to 200V, VBUS = 400V, ISW = –2.5A, at below high-side slew rate settings | |||||
| slew rate setting 0 (slowest) | 210 | ns | ||||
| slew rate setting 1 | 95 | |||||
| slew rate setting 2 | 65 | |||||
| slew rate setting 3 (fastest) | 30 | |||||
| BST | ||||||
| Start-up time from deep BST to SW discharge | From VBST_SW > VBST_SW,T+(UVLO) to high-side reacts to INH or GDH high level with VBST_SW rising from 0V to 10V in 1µs | 5 | µs | |||
| Start-up time from shallow BST to SW discharge | From VBST_SW > VBST_SW,T+(UVLO) to high-side reacts to INH or GDH high level with VBST_SW rising from 5V to 10V in 0.5µs | 3.2 | µs | |||