SNOU176B October   2020  – March 2022

PRODUCTION DATA  

  1.   Trademarks
  2. 1 General TI High Voltage Evaluation User Safety Guidelines
    1. 1.1 Safety and Precautions
  3. 2 Introduction
    1. 2.1 LMG342XEVM-04X Daughter Card
      1. 2.1.1 FAULT and OC
      2. 2.1.2 Power Pins
      3. 2.1.3 Bootstrap Mode
      4. 2.1.4 Heat Sink
    2. 2.2 Mother Boards
      1. 2.2.1 Bias Supply
      2. 2.2.2 PWM Input
      3. 2.2.3 Fault Protection
    3. 2.3 Typical Applications
    4. 2.4 Features
  4. 3  LMG342XEVM-04X Schematic
  5. 4 Mother Board Schematic
  6. 5 Recommended Footprint
  7. 6 Test Equipment
  8. 7 Test Procedure When Paired With LMG342X-BB-EVM
    1. 7.1 Setup
    2. 7.2 Start-Up and Operating Procedure
    3. 7.3 Test Results
    4. 7.4 Shutdown Procedure
    5. 7.5 Additional Operating Notes
  9. 8 Test Procedure When Paired With LMG34XX-BB-EVM
    1. 8.1 Setup
      1. 8.1.1 List of Test Points
      2. 8.1.2 List of Terminals
    2. 8.2 Start-Up and Operating Procedure
    3. 8.3 Shutdown Procedure
    4. 8.4 Additional Operation Notes
  10. 9 Bill of Materials
  11. 10Revision History

8.1.1 List of Test Points

Key test points on this EVM are designed for oscilloscope probes with short ground springs. Using short ground springs instead of alligator ground leads will minimize measurement error and produce a cleaner signal with the fast switching GaN devices used on this EVM. The data in this user guide uses this measurement method.

Table 8-1 Test Point Functional Description
NAME DESCRIPTION
VAUX 12-V bias input connection before filter
ACMGND Ground for 12-V bias input before filter
5V 5-V bias
AGND1 Analog ground for logic
PWM Single input PWM signal
LDEAD1 Low-side PWM signal before dead time generation
AGND3 Analog ground for logic
HDEAD1 High-side PWM signal before dead time generation
AGND4 Analog ground for logic
LOW Low-side PWM signal with dead time
HIGH High-side PWM signal with dead time
AGND2 Analog ground for logic
12V 12-V bias after filter
PGND1 Power ground
HVIN DC input voltage
PGND2 Power ground
HVOUT DC output voltage
PGND3 Power ground
SW1 Switch node voltage

For this EVM version, not all the test points are available on the motherboard due to the size of the daughter card. To probe the switching node, TI recommends using a pigtail on the daughter card on PGND pin. A probe could use the PGND pigtail and SW test point on the daughter card to complete the measurement.