SNVSB03E December 2018 – May 2026 TPS3840
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| tSTRT | Startup Delay(1) | CT pin open | 100 | 220 | 350 | µs |
| tP_HL | Propagation detect delay for VDD falling below VIT- | VDD = VIT+ to (VIT-) - 10%(2) | 15 | 30 | µs | |
| tD | Reset time delay(3) | CT
pin = open |
50 | µs | ||
| CT pin = 10nF | 6.2 | ms | ||||
| CT pin = 1 µF | 619 | ms | ||||
| tGI_VIT- | Glitch immunity VIT- | 5% VIT- overdrive(4) | 10 | µs | ||
| tMR_PW | MR pin pulse duration to initiate reset | 300 | ns | |||
| tMR_RES | Propagation delay from MR low to reset | VDD = 4.5V, MR < VMR_L | 700 | ns | ||
| tMR_tD | Delay from release MR to deasert reset | VDD = 4.5V, MR = VMR_L to VMR_H |
tD | ms | ||
